Carrier Optical Positioning for Automated Sample Testing
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Solution Overview
Problem
Existing sample testing systems require multiple machines and significant labor for processing and analyzing test sample cards, as they necessitate manual handling and separate machines for vacuum loading, sealing, and optical analysis, which is time-consuming and inefficient.
Innovation Solution
A carrier with built-in optical interrupt positioning features that allows precise tracking of test sample devices as they move through the testing instrument, enabling automated sealing and loading operations, thereby integrating vacuum loading, sealing, and optical analysis into a single instrument.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual handling and separate machines are used for vacuum loading, sealing, and optical analysis, then operational flexibility is maintained, but labor requirements and processing time increase significantly
Solution Approach 1:
The patent combines vacuum loading, sealing, and optical analysis functions into a single integrated instrument with a unified carrier system. The carrier includes built-in positioning features that enable automated tracking and coordination of all operations within one machine, eliminating the need for separate devices and manual handling while maintaining operational flexibility through programmable control.
2Adaptability or versatility
If multiple separate machines are used for processing test sample cards, then functional specialization is achieved, but device complexity and space requirements increase
Solution Approach 1:
The integrated instrument performs multiple specialized functions (vacuum loading, sealing, optical analysis) within a single device. The carrier design with standardized positioning features enables the instrument to handle various test sample formats, while the modular functional modules maintain specialized capabilities without requiring separate machines.
3Measurement precision
If automated tracking and positioning features are added to the carrier, then processing accuracy and automation level improve, but carrier structural complexity increases
Solution Approach 1:
The patent replaces complex mechanical positioning mechanisms with optical tracking. The carrier includes simple geometric positioning features (such as recesses or protrusions) that are detected by optical sensors, enabling precise automated tracking without requiring complex mechanical structures or active components on the carrier itself.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution streamlines the sample testing process by reducing manual labor and machine requirements, enhancing efficiency and throughput by allowing for automated tracking and processing of test sample devices within a single instrument, thereby improving the speed and accuracy of sample analysis.
Implementation Method 1
The instrument includes fixed optical interrupt sensors for detecting the position of the positioning feature as the carrier is moved through the instrument
Data Source
AI summary
A carrier for holding up to N test sample devices as they are moved through a sample testing instrument. Each of the test sample devices are held in a receiving structure such as a slot in the carrier. The carrier also includes N optical interrupt positioning features, each placed in registry with one of the receiving structures (and thereby in registry with the test sample device). The instrument includes fixed optical interrupt sensors for detecting the position of the positioning feature as the carrier is moved through the instrument. In the illustrated embodiment, the position features comprise voids formed in a rib on the lower surface of the carrier. The optical interrupt sensors are positioned below the path the carrier travels over, whereby as the carrier moves past the sensor the voids, and hence position of the test sample devices, are detected.