Cascaded Test Wiring Structure for LCD Panel Efficiency
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Solution Overview
Problem
The traditional Power Up Test method for liquid crystal display panels is inefficient due to the need to prick a test pad for each panel, resulting in excessive time consumption when testing a large number of panels simultaneously.
Innovation Solution
A test wiring structure with sequentially cascaded signal wirings, where each signal wiring has a first interface, a second interface, and a cascade interface, allowing connections between stages to enable a single test pad to be used for multiple panels, reducing the need for repeated pricking and increasing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a test pad is pricked once for each liquid crystal display panel, then the test can be performed accurately, but the test time becomes excessively long when testing a large number of panels simultaneously
Solution Approach 1:
Multiple signal wirings are merged into a single integrated test structure that cascades through multiple panels. The test pad connects to the first interface of the first signal wiring, which cascades to subsequent signal wirings, allowing one test pad to serve multiple panels simultaneously while maintaining accurate signal transmission for each panel.
Solution Approach 2:
A single test pad is designed to perform multiple testing functions across different panels through the cascaded signal wiring structure. The test pad universally connects to multiple display panels via the cascade interfaces, enabling one test pad to replace what would traditionally require multiple separate test pads, thereby reducing test time without compromising accuracy.
2Productivity
If multiple test pads are used to test multiple panels simultaneously, then the test efficiency increases, but the device complexity and cost increase
Solution Approach 1:
The patent merges multiple testing functions into a single test pad by combining multiple signal wirings into a cascaded structure. This integration allows one test pad to test multiple panels simultaneously, improving productivity while reducing device complexity compared to using multiple separate test pads.
Solution Approach 2:
The test structure is segmented into modular signal wirings with standardized cascade interfaces. Each signal wiring can be independently configured but connects through uniform cascade interfaces, allowing the system to scale efficiently without proportionally increasing complexity. This modular segmentation enables high productivity with controlled complexity.
3Loss of time
If a single test pad is used for multiple panels, then the test time is reduced, but the signal wiring structure becomes more complex
Solution Approach 1:
The signal wiring is divided into discrete, modular segments with standardized cascade interfaces. Each segment (signal wiring) is a simple, repeatable unit that connects to the next through a defined interface. This segmentation reduces the perceived complexity by breaking down the overall complex structure into manageable, identical modules that can be easily replicated and connected.
Solution Approach 2:
The patent changes the structural parameter of the signal wiring from traditional point-to-point connections to a cascaded topology with standardized interfaces. This parameter change in the wiring architecture enables a single test pad to efficiently reach multiple panels through a structured, scalable cascade path, reducing test time while keeping the wiring structure systematic and manageable rather than chaotic or overly complex.
Data Source
AI summary
Disclosed herein are a test wiring structure, a test apparatus and a test system. The test wiring structure includes sequentially cascaded signal wirings. Each signal wiring includes a first interface and a second interface respectively located at the two ends of the signal wiring, and a cascade interface disposed on the signal wiring. In the sequentially cascaded signal wirings, the first interface and the second interface of a previous-stage signal wiring are respectively connected to the cascade interfaces of corresponding signal wirings in next-stage signal wirings. Moreover, the cascade interface of a first-stage signal wiring is used to connect to a test pad, and the first interfaces and the second interfaces of last-stage signal wirings are respectively used to connect to corresponding display panels.