Cavity Imaging Brightfield Darkfield Illumination
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Solution Overview
Problem
Existing apparatuses for imaging the inner surface of cavities in workpieces are limited in their ability to detect defects, as they primarily utilize either brightfield or darkfield illumination, missing the comprehensive defect detection capabilities of both methods.
Innovation Solution
The apparatus combines brightfield and darkfield illumination techniques by positioning the illumination system to illuminate different axial sections of the imaging region simultaneously or sequentially, using a mirror arrangement to direct light beams for both types of illumination, allowing for enhanced defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If only brightfield illumination is used, then scratches and porosities can be detected, but casting defects cannot be detected
Solution Approach 1:
The patent combines brightfield and darkfield illumination methods into a single imaging apparatus. The illumination system includes a light source that can be positioned to provide both brightfield illumination (for detecting scratches and porosities) and darkfield illumination (for detecting casting defects), merging the advantages of both methods into one system to achieve comprehensive defect detection
Solution Approach 2:
The imaging apparatus is designed with multi-functional illumination capabilities. The same optical system and imager can operate with different illumination configurations (brightfield, darkfield, or both simultaneously) to detect various types of defects, making the apparatus universally applicable for comprehensive surface inspection
2Measurement precision
If only darkfield illumination is used, then casting defects can be detected, but scratches and porosities cannot be detected
Solution Approach 1:
The patent combines brightfield and darkfield illumination methods into a single imaging apparatus. The illumination system includes a light source that can be positioned to provide both brightfield illumination (for detecting scratches and porosities) and darkfield illumination (for detecting casting defects), merging the advantages of both methods into one system to achieve comprehensive defect detection
Solution Approach 2:
The imaging apparatus is designed with multi-functional illumination capabilities. The same optical system and imager can operate with different illumination configurations (brightfield, darkfield, or both simultaneously) to detect various types of defects, making the apparatus universally applicable for comprehensive surface inspection
3Measurement precision
If sequential imaging under brightfield and darkfield illumination is used, then comprehensive defect detection is achieved, but imaging time increases
Solution Approach 1:
The patent combines brightfield and darkfield illumination methods into a single imaging apparatus. The illumination system includes a light source that can be positioned to provide both brightfield illumination (for detecting scratches and porosities) and darkfield illumination (for detecting casting defects), merging the advantages of both methods into one system to achieve comprehensive defect detection
Solution Approach 2:
The apparatus enables continuous imaging with both illumination methods simultaneously or in rapid succession. By having both illumination paths available in the same optical system, the device can maintain continuous operation without requiring separate imaging steps for different illumination types, reducing total inspection time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables comprehensive and informative defect detection, allowing for the simultaneous or sequential imaging of sections under brightfield and darkfield illumination, improving the apparatus's capability to identify scratches, porosities, and casting defects in workpieces.
Implementation Method 1
In brightfield illumination, in which the light reflected by the inner surface to be imaged is used for imaging
Implementation Method 2
in darkfield illumination in which the beam path of the light is routed so as to utilize primarily those rays scattered from the inner surface to be imaged
Data Source
AI summary
An apparatus for imaging the inner surface of a cavity in a workpiece has an optical system including a panoramic field of view that is linked to an imager and a downstream evaluation device by an image communication link. The apparatus furthermore has an illumination system including a light source to illuminate an imaging region of the inner surface, which region has been captured by the optical system. According to the invention, the illumination system is disposed in such a way relative to optical system, and for which the beam path is selected in such a way, that a first axial section of the imaging region is able to be illuminated under brightfield illumination, while simultaneously a second axial region spaced apart from the first axial region is able to be illuminated under darkfield illumination.