Integrated CCA Testing System Reducing Ambiguity via Analog Signature Analysis
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Solution Overview
Problem
Current Automated Test Equipment (ATE) systems for Circuit Card Assemblies (CCAs) are inefficient and costly due to the need for separate systems for parametric, diagnostic, and analog signature analysis, leading to time-consuming and costly testing processes that often fail to reliably detect component-based failures.
Innovation Solution
An integrated Automated Circuit Card Automated Test (ACCAT) system combining automated probing, parallel test executive software, Command and Control Software, industry-standard parametric test instrumentation, and Analog Signature Analysis (ASA) technology to perform comprehensive functional, parametric, and diagnostic testing within a single system, reducing ambiguity and manpower requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate systems are used for parametric testing, diagnostic testing, and analog signature analysis, then each testing function can be performed with specialized equipment, but the overall testing process becomes time-consuming and costly
Solution Approach 1:
The patent combines parametric testing equipment, diagnostic testing equipment, and analog signature analysis equipment into a single integrated ATE system. This merging eliminates the need to transfer CCAs between separate systems, performs all testing functions in one location, and reduces overall testing time while maintaining the specialized capabilities of each individual testing type through modular instrument design
2Measurement precision
If separate systems are used for parametric testing, diagnostic testing, and analog signature analysis, then each testing function can be performed with specialized equipment, but the system complexity and cost increase
Solution Approach 1:
The ATE system is designed with multi-functional instruments that can perform parametric testing, diagnostic testing, and analog signature analysis. The system uses a universal architecture with a common controller, switch matrix, and measurement infrastructure that can be configured for different testing types, reducing overall system complexity compared to maintaining separate specialized systems
Solution Approach 2:
The integrated ATE system employs modular instrument design where each testing function ( parametric, diagnostic, ASA) is implemented as a separate module or subsystem. These modules communicate through a standardized interface and are coordinated by a central controller, allowing the system to maintain specialized capabilities while benefiting from integration
3Adaptability or versatility
If manual probing is used for diagnostic testing, then flexibility and adaptability are maintained, but accuracy, speed, and safety are compromised
Solution Approach 1:
The system uses automated probing mechanisms that can independently locate and probe test points on the CCA without requiring manual intervention. The automated prober is controlled by software that directs it to specific locations based on the testing requirements, maintaining flexibility while eliminating the accuracy and safety issues associated with manual probing
4Ease of repair
If comprehensive testing is performed to identify specific faulty components, then repair cost is minimized and repair speed is maximized, but the testing scope and complexity increase
Solution Approach 1:
The system performs comprehensive parametric, diagnostic, and analog signature analysis testing before the CCA is deployed to the field. This preliminary testing identifies potential failures early in the manufacturing or maintenance process, allowing for proactive repair or replacement before the equipment is put into service, thereby minimizing the impact of failures when they do occur
Data Source
AI summary
The system includes an integrated sequenced arrangement of parametric type instruments, automated guided prober test instruments, and a test instrument system using analog signature analysis for identifying faults in circuit card assemblies, under control of a software system with a mass interconnect system.