Cell-Aware Defect Characterization Using Multiple Strobe Points
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Solution Overview
Problem
Existing cell-aware defect characterization methods have limited accuracy in predicting the effects of defects on complex IC performance and require significant computing resources, especially when dealing with both static and dynamic timing errors, often necessitating separate simulation passes.
Innovation Solution
A computer-implemented method that uses a multitude of strobes to simulate circuit timing characteristics with and without defects, allowing for the identification of associations between test vectors and defects during a single simulation pass, thereby improving accuracy and reducing computational resources.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If transistor level characterization is used to predict circuit performance, then measurement precision is improved, but computing resources and simulation time increase significantly
Solution Approach 1:
The patent segments the simulation process by applying multiple strobes at different time points within a single simulation pass, allowing the system to capture both static and dynamic timing errors without requiring separate simulation passes. This segmentation of the timing analysis into discrete observation points enables high measurement precision while maintaining computational efficiency.
2Measurement precision
If separate simulation passes are used to detect static and dynamic timing errors, then measurement precision is improved, but computing resources and simulation time increase
Solution Approach 1:
The patent merges the detection of static and dynamic timing errors into a single simulation pass by applying multiple strobes at different time points. This combining of multiple detection functions into one unified process reduces computational overhead and simplifies the simulation workflow while maintaining the ability to detect both types of timing errors with high precision.
Solution Approach 2:
The simulation methodology achieves multi-functionality by using a single simulation pass that simultaneously detects both static timing errors (setup/hold violations) and dynamic timing errors (transition timing issues). The multiple strobes enable the same simulation to serve multiple characterization purposes, reducing the need for separate specialized simulation passes.
3Productivity
If logic level simulation is used instead of transistor level simulation, then computing resources are reduced, but measurement precision deteriorates
Solution Approach 1:
The patent applies preliminary action by performing transistor-level accurate timing analysis through multiple strobes before proceeding to logic-level simulation for broader circuit characterization. This preliminary high-precision timing measurement at the transistor level provides accurate baseline data that can then be used in logic-level simulations, maintaining measurement precision while enabling efficient large-scale circuit analysis.
Data Source
AI summary
A computer-implemented method for characterizing a circuit is presented. The method includes receiving, by the computer, data representative of the circuit and at least one defect of the circuit. The method further includes simulating, using the computer, the circuit to obtain a first timing characteristic, and simulating, using the computer, the circuit with the at least one defect to obtain a second timing characteristic. The method further includes identifying, using the computer, an association between at least one test vector and the at least one defect in accordance with the first timing characteristic, the second timing characteristic, and a multitude of strobes applied during a first time interval associated with the at least one test vector, when the computer is invoked to characterize the circuit.