Centralized MBIST Failure Information Storage
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Solution Overview
Problem
In integrated circuits with multiple storage arrays, existing methods require reading from multiple arrays to access failure and repair information, which is inefficient and time-consuming, especially when this information needs to be utilized for failure analysis and repair.
Innovation Solution
Storing test information, including failure and repair data, in a centralized array within the integrated circuit, allowing for efficient retrieval and duplication in each storage array under test, thereby reducing the need for individual array accesses and facilitating centralized data mining.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If test information is stored in each individual array under test, then the information is locally available for repair, but reading from multiple arrays is required which increases test time and reduces productivity
Solution Approach 1:
The patent consolidates test information from multiple individual arrays into a single centralized array. Instead of storing failure and repair information separately in each array under test, all test results are collected and stored in one centralized location. This merging approach maintains the availability of repair information while eliminating the need to read from multiple arrays, thereby reducing test time and improving productivity.
2Productivity
If test information is stored only in the centralized array, then test time is reduced, but local backup storage is lost which may affect repair reliability
Solution Approach 1:
The patent implements a copying strategy where test information is stored in two locations: the centralized array for efficient retrieval and individual arrays under test for local backup. This ensures that repair information is both centrally accessible for rapid processing and locally available for reliability, eliminating the trade-off between test time and repair reliability.
3Ease of repair
If failure information is stored in the array under test itself, then local repair is enabled, but reading hundreds of arrays is required which increases device complexity
Solution Approach 1:
The patent extracts test information from multiple individual arrays and consolidates it into a single centralized array. This extraction approach maintains the ability to perform local repairs by keeping information in the array under test, while simultaneously reducing device complexity by eliminating the need to read from hundreds of different arrays. The centralized array serves as a single point of access for all test information.
Data Source
AI summary
Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.