Multilayered Ceramic Capacitor Electrode Segmentation for Impurity Resistance

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Solution Overview

Problem

Multilayered ceramic capacitors face issues with impurities infiltrating through corner portions of inner electrodes, degrading insulation resistance and reliability due to thin dielectric layers and narrow margin portions, especially in smaller capacitors with high capacity requirements.

Innovation Solution

A multilayered ceramic electronic component design featuring first inner electrodes with a narrower exposed width than their inner width, and second inner electrodes with equal exposed and inner widths, alternately exposed from both ends, and a method for fabricating these components with specific electrode ratios and configurations to prevent impurity infiltration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If inner electrodes are formed with minimized margin portions to reduce capacitor size, then capacity increases, but impurity infiltration through corner portions increases

Engineering Contradiction:
ImprovecapacityVSAvoidinsulation resistance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent segments the inner electrodes into two types: first inner electrodes with narrowed exposed portions and second inner electrodes with standard exposed portions. This segmentation allows different regions to serve different functions - the first type prevents impurity infiltration while the second type maintains electrical connectivity, resolving the contradiction between minimizing margin portions and preventing impurity infiltration.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by making the exposed portions of first inner electrodes narrower than other portions, creating a localized structural variation. This local narrowing specifically addresses the corner portions where impurity infiltration occurs, while maintaining standard dimensions in other areas to ensure overall functionality.

Inventive Principle:
Principle #3Local quality

2Volume of moving object

If dielectric layers are thinned to reduce capacitor size, then overall dimensions decrease, but susceptibility to impurity infiltration increases

Engineering Contradiction:
Improvecapacitor sizeVSAvoidimpurity infiltration
Core Design Contradiction:
Volume of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary anti-action by pre-configuring the first inner electrodes with narrowed exposed portions before the impurity infiltration problem occurs. This structural design proactively prevents impurity infiltration through corner portions, countering the increased susceptibility caused by thinned dielectric layers.

Inventive Principle:
Principle #9Preliminary anti-action

3Quantity of substance

If margin portions are narrowed to increase capacity, then capacitance increases, but crack generation risk increases

Engineering Contradiction:
ImprovecapacitanceVSAvoidstructural integrity
Core Design Contradiction:
Quantity of substanceVSStrength

Solution Approach 1:

The patent segments the electrode structure to distribute the mechanical stress. By having first inner electrodes with narrowed portions and second inner electrodes with standard portions alternating in the stack, the structure better accommodates thermal expansion and mechanical stress, reducing crack generation risk while maintaining narrow margin portions for high capacitance.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS8711545B2Multilayered ceramic electronic component and fabrication method thereof
Publication Date: 2014.04.29 SAMSUNG ELECTRO MECHANICS CO LTD
  • US8711545B2 patent drawing
  • US8711545B2 patent drawing
  • US8711545B2 patent drawing

AI summary

A multilayered ceramic electronic component includes: a ceramic element having a plurality of dielectric layers laminated therein; first inner electrodes formed on the dielectric layers disposed in upper and lower portions in the ceramic element, the width of a portion of each of the first inner electrodes exposed from one end face of the ceramic element being less than that of a portion thereof disposed within the ceramic element; and second inner electrodes formed on the dielectric layers disposed in the middle portion in the ceramic element, the width of a portion of each of the second inner electrodes exposed from one end face of the ceramic element being equal to that of a portion thereof disposed within the ceramic element.