Laminated Ceramic Capacitor Interface Layer for Insulation Reliability
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Solution Overview
Problem
The reduction in thickness of dielectric layers in laminated ceramic capacitors leads to degraded insulation reliability due to the presence of intermediate layers with concentrated secondary elements, which inadvertently reduce the bonding strength between internal electrode layers and dielectric layers.
Innovation Solution
Incorporating first intermediate layers with a secondary element concentration 1.2 times that of the internal electrode layers and featuring high concentration regions 1.5 times the average concentration, enhancing bonding strength by creating a higher Schottky barrier and anchor effect.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If intermediate layers with concentrated secondary elements are added to improve insulation reliability, then insulation reliability is improved, but bonding strength between internal electrode layers and dielectric layers decreases
Solution Approach 1:
The patent applies local quality by creating high concentration regions of the secondary element within the intermediate layer, rather than uniform distribution. This localized concentration approach maintains the Schottky barrier height improvement for insulation reliability while reducing the overall amount of secondary element that could harm bonding strength.
Solution Approach 2:
The patent changes the concentration parameter of the secondary element within the intermediate layer, specifically creating regions where the concentration is 1.5 times or more the average concentration. This parameter optimization allows achieving sufficient insulation reliability while minimizing the negative impact on bonding strength.
2Quantity of substance
If the thickness of dielectric layers is reduced to increase capacitance, then capacitance increases, but insulation reliability degrades
Solution Approach 1:
The patent introduces an intermediate layer as a mediator between the dielectric layer and internal electrode layer. This intermediate layer contains a secondary element that forms a Schottky barrier, which compensates for the reduced insulation reliability caused by thinner dielectric layers, thereby enabling higher capacitance while maintaining insulation reliability.
Solution Approach 2:
The patent uses composite materials by combining the primary metal element (e.g., Ni) with a secondary element (e.g., Sn, Pb, Zn, In, Ga, Fe, Co, Cu, Al, Ag, Au, Pt, Pd, Ir, Rh, Mo, W, Ti) in the intermediate layer. This composite structure creates a Schottky barrier that enhances insulation reliability without requiring thicker dielectric layers.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents a decrease in bonding strength, thereby improving insulation reliability and extending the service life of laminated ceramic capacitors.
Implementation Method 1
the intermediate layers can increase the height of the Schottky barrier between the dielectric layers and the internal electrode layers
Implementation Method 2
enhancing bonding strength by creating a higher Schottky barrier and anchor effect
Data Source
AI summary
A laminated ceramic capacitor includes a body, first and second external electrodes, and a first intermediate layer. The body includes first and second internal electrode layers, a dielectric layer disposed between the first and second internal electrode layers in a first direction, and a first intermediate layer. The first internal electrode layer contains a main component metal element and an element X different from the main component metal element. The first intermediate layer is disposed between the first internal electrode layer and the dielectric layer and contains the element X at a concentration 1.2 or more times a concentration of the element X in the first internal electrode layer. The first intermediate layer includes at least one first high concentration region where the element X is present at a concentration 1.5 or more times an average concentration of the element X in the entire first intermediate layer.