Multilayered Ceramic Component Margin Inspection
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Solution Overview
Problem
In multilayered ceramic electronic components, the L-direction margin is often insufficient, leading to defects and insulation resistance deterioration due to its internal location, making it difficult to detect defective chips during fabrication, especially under high-temperature or high-moisture conditions.
Innovation Solution
Incorporating a minimum margin indicating part into the internal electrode patterns during the fabrication of multilayered ceramic components, allowing for visible inspection of the L-direction margin, enabling easy detection of defective chips and ensuring a sufficient L-direction margin.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the L-direction margin is made larger to protect internal electrodes from electrical stress and moisture, then reliability is improved, but the chip size increases and capacitance density decreases
Solution Approach 1:
The patent applies preliminary action by forming the L-direction margin indicating part during the green sheet stacking process, before final sintering and cutting. This allows the margin structure to be pre-established in the green state, ensuring proper margin dimensions are built-in before irreversible sintering occurs, thereby protecting internal electrodes without requiring additional post-processing steps that would increase chip size
Solution Approach 2:
The patent introduces an intermediary element - the L-direction margin indicating part - which serves as a visible marker that mediates between the internal structure (margin) and external inspection. This indicating part allows the margin to be visually verified without requiring physical measurement or destruction of the component, enabling quality control while maintaining compact dimensions
2Reliability
If the dielectric layer thickness is reduced to increase the number of stacked layers, then capacitance is improved, but manufacturing precision requirements increase and defects may occur
Solution Approach 1:
The patent applies parameter changes by systematically reducing dielectric layer thickness while adjusting other parameters (number of layers, margin dimensions, indicating part size) to maintain overall capacitance and reliability. The indicating part size is specifically optimized to be visible (≥10 μm) while the actual dielectric layers are thinned for high capacitance, demonstrating coordinated parameter optimization
Solution Approach 2:
The patent replaces mechanical measurement methods with optical detection by introducing the L-direction margin indicating part. Instead of using physical measurement tools to verify margin dimensions after cutting, the visual indication system allows optical inspection during or after cutting, simplifying quality control and reducing the impact of manufacturing precision variations
3Manufacturing precision
If the W-direction margin is verified by cutting and inspection to ensure minimal margin, then manufacturing precision is improved, but the L-direction margin remains undetected and defective chips are not identified
Solution Approach 1:
The patent applies color changes by using the L-direction margin indicating part that creates a visible visual difference (color or pattern contrast) at the margin location. This allowing inspectors to easily distinguish the margin area from the electrode area during visual inspection, making the previously undetectable L-direction margin visible without requiring complex measurement equipment
Solution Approach 2:
The patent transitions from two-dimensional internal margin measurement to three-dimensional visual indication by extending the margin information to the surface level. The indicating part protrudes or patterns the surface at the L-direction margin location, converting an internal dimensional parameter into an external visual feature that can be inspected from another dimension (surface level)
4Ease of operation
If visual inspection method is used to detect L-direction margin, then ease of operation is improved, but measurement precision may be insufficient for very small margins
Solution Approach 1:
The patent applies copying by creating a surface-level replica or indication of the internal L-direction margin dimension. The margin indicating part copies the margin dimension information onto the visible surface, allowing visual inspection to accurately reflect the actual margin size. This copying mechanism enables simple visual detection while maintaining measurement precision equivalent to the actual margin dimension
Data Source
AI summary
There is provided a multilayered ceramic electronic component including: a multilayered body in which a plurality of dielectric layers are stacked; a plurality of first and second internal electrodes formed on the dielectric layers so as to be alternately exposed through end surfaces; a minimum margin indicating part formed on an L-direction margin part on which the first or second internal electrode is not formed on the dielectric layer and indicating a minimum size of the L-direction margin part, the L-direction minimum margin indicating part being inserted on the ceramic sheet, whereby a multilayered ceramic electronic component having high capacitance while reducing a defect and having excellent reliability may be implemented.