Ceramic Electronic Component Delamination Suppression via Electrode Columns

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Solution Overview

Problem

Ceramic electronic components face delamination issues, particularly in severe environments, as existing technologies do not effectively suppress delamination between internal electrode layers and dielectric ceramic layers.

Innovation Solution

The design incorporates ceramic columns within through holes of internal electrodes, with a higher area ratio at the ends compared to the central portion, using the same ceramic material as the component body, to prevent delamination without compromising capacitance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the area ratio of the ceramic column to the internal electrode is increased, then delamination suppression is improved, but capacitance is reduced

Engineering Contradiction:
Improvedelamination suppressionVSAvoidcapacitance
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent applies local quality by making the ceramic column's area ratio variable across different regions of the internal electrode. Specifically, the area ratio is set to be greater than 1/10 and not more than 1/5 at central portions, and greater than 1/5 and not more than 3/10 at end portions. This spatial variation in area ratio allows the structure to provide enhanced delamination suppression at critical end regions while maintaining adequate capacitance through the overall electrode design.

Inventive Principle:
Principle #3Local quality

2Reliability

If ceramic columns are added to suppress delamination, then reliability is improved, but device complexity is increased

Engineering Contradiction:
Improvedelamination suppressionVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the internal electrode into multiple regions (central portions and end portions) with different area ratio requirements for ceramic columns. This regional segmentation allows targeted reinforcement at critical locations (end portions with higher area ratios) while using fewer ceramic columns in less critical areas (central portions), thereby reducing overall structural complexity compared to a uniform high-density column arrangement.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies parameter changes by varying the area ratio parameter of ceramic columns across different regions of the internal electrode. The area ratio is controlled within specific ranges: greater than 1/10 and not more than 1/5 at central portions, and greater than 1/5 and not more than 3/10 at end portions. This parameter optimization enables effective delamination suppression while controlling the number and size of ceramic columns to manage structural complexity.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9922767B2Ceramic electronic component and manufacturing method therefor
Publication Date: 2018.03.20 MURATA MFG CO LTD
  • US9922767B2 patent drawing
  • US9922767B2 patent drawing
  • US9922767B2 patent drawing

AI summary

A ceramic electronic component includes an electronic component ceramic main body and internal electrodes disposed within the electronic component main body. The internal electrodes include through holes passing through the internal electrodes in the thickness direction. Ceramic columns are disposed in the through holes and connect the ceramic on one side of the internal electrodes and the ceramic on the other side thereof. An area ratio of the ceramic columns to ends of the internal electrodes located within the electronic component main body is greater than an area ratio of ceramic columns to central portions of the internal electrodes.