Multilayer Ceramic Device R Segregation Insulation

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Solution Overview

Problem

Conventional multilayer ceramic electronic devices face challenges in achieving high insulation resistance and accelerated lifetime at higher temperatures and voltages, with existing solutions not adequately addressing the need for improved reliability and dielectric properties.

Innovation Solution

The multilayer ceramic electronic device incorporates a dielectric ceramic composition with a main component of ABO3 and a rare-earth component R, featuring R segregation phases unevenly distributed near internal electrode layers, along with Si segregation phases, to enhance insulation resistance and accelerated lifetime without compromising dielectric loss or specific permittivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If the dielectric layer is thinned to increase lamination number for downsizing, then the device size is reduced and capacity is increased, but the insulation resistance and reliability deteriorate

Engineering Contradiction:
Improvedevice sizeVSAvoidinsulation resistance
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The patent applies local quality by creating non-uniform distribution of R segregation phases within the dielectric layer. Specifically, the concentration of R segregation phases is made higher in regions adjacent to internal electrode layers compared to central regions. This localized modification of phase distribution enhances insulation resistance at critical interfaces without requiring overall thickening of the dielectric layer, thus resolving the contradiction between downsizing and maintaining reliability.

Inventive Principle:
Principle #3Local quality

2Productivity

If conventional dielectric compositions are used to achieve thin dielectric layers, then lamination number can be increased, but highly accelerated lifetime at higher temperature and voltage is insufficient

Engineering Contradiction:
Improvelamination numberVSAvoidhighly accelerated lifetime
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent employs composite materials by combining the main dielectric component ABO3 with rare-earth component R to form a composite ceramic composition. The R segregation phases that form within this composite structure provide enhanced stability and insulation properties at high temperatures and voltages, enabling higher lamination numbers while maintaining improved highly accelerated lifetime performance.

Inventive Principle:
Principle #40Composite materials

3Reliability

If R segregation phases are uniformly distributed in the dielectric layer, then the dielectric properties are maintained, but insulation resistance and accelerated lifetime are not sufficiently improved

Engineering Contradiction:
Improveinsulation resistanceVSAvoiddielectric properties
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent resolves this contradiction by implementing local quality through spatially varying concentration of R segregation phases. The non-uniform distribution pattern— with higher concentration near internal electrode layers and lower concentration in central regions—enables enhanced insulation resistance at critical interfaces while maintaining overall dielectric stability through the presence of R phases throughout the structure.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS9305708B2Multilayer ceramic electronic device
Publication Date: 2016.04.05 TDK CORP
  • US9305708B2 patent drawing
  • US9305708B2 patent drawing
  • US9305708B2 patent drawing

AI summary

A multilayer ceramic electronic device comprising a lamination in which an internal electrode layer 3 and a dielectric layer 2 are laminated alternatively, wherein the dielectric layer 2 is comprised of a dielectric ceramic composition including a main component represented by a general formula of ABO3 and a rare-earth component R, and segregation phases 5 including the rare-earth component R are present in the dielectric layer 2. When the dielectric layer 2 is separated to six areas by dividing the dielectric layer 2 sandwiched by a pair of the internal dielectric layers 3 in the thickness direction, there are the R segregation phases present in two neighboring areas 2a respectively adjacent to the pair of the internal electrode layers 3 in the dielectric layer 3 at a ratio of double or more compared with the R segregation phases present in two central areas 2b located at a substantially center in the dielectric layer 2.