Engineered Ceramic Substrates for Uniform GaN Epitaxy

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The heteroepitaxial growth of gallium nitride based LED structures on sapphire substrates leads to reduced uniformity and adverse effects on the electronic/optical properties of the epitaxial layers, necessitating improved methods and systems for epitaxial growth processes.

Innovation Solution

The development of an engineered substrate structure with a coefficient of thermal expansion (CTE) matched to epitaxial layers, comprising a polycrystalline ceramic core, adhesion layers, a conductive layer, and a barrier layer, which simplifies process integration and enhances the match with gallium nitride-based epitaxial and device layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If heteroepitaxial growth is used to grow gallium nitride LED structures on sapphire substrates, then LED devices can be manufactured, but the uniformity and electronic/optical properties of the epitaxial layers deteriorate

Engineering Contradiction:
Improveuniformity of epitaxial layersVSAvoidsubstrate structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The substrate structure is divided into multiple functional layers including a sapphire substrate, buffer layer, adhesion layer, and epitaxial layer. Each layer serves a specific purpose: the sapphire substrate provides mechanical support, the buffer layer manages thermal expansion mismatch, the adhesion layer ensures strong bonding, and the epitaxial layer contains the active LED structures. This segmentation allows optimization of each layer independently to achieve high uniformity without excessive overall complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention employs a composite substrate structure combining multiple materials (sapphire, silicon oxide, silicon nitride, gallium nitride) with complementary properties. The sapphire substrate provides thermal stability and mechanical strength, while the silicon oxide and silicon nitride layers provide adhesion and stress management. This composite approach enables the epitaxial layers to grow with high uniformity by compensating for the inherent mismatches between different materials.

Inventive Principle:
Principle #40Composite materials

2Reliability

If heteroepitaxial growth is used on sapphire substrates, then LED devices can be produced, but the electronic and optical properties of the epitaxial layers deteriorate

Engineering Contradiction:
Improveelectronic/optical propertiesVSAvoidsubstrate structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A buffer layer and adhesion layer are introduced as intermediary layers between the sapphire substrate and the gallium nitride epitaxial layer. The buffer layer (typically silicon oxide or silicon nitride) acts as a mediator that reduces the lattice mismatch and thermal expansion coefficient difference between sapphire and GaN. This intermediary approach preserves the electronic and optical properties of the epitaxial layers by minimizing defect formation, while the overall structure remains manageable through standardized layer configurations.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If a CTE-matched substrate structure is engineered with multiple layers, then uniformity and properties of epitaxial layers improve, but the substrate structure complexity increases

Engineering Contradiction:
Improveuniformity of epitaxial layersVSAvoidsubstrate structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention optimizes the thickness, material composition, and thermal expansion coefficients of each layer in the substrate structure to achieve overall CTE matching with the gallium nitride epitaxial layer. By carefully controlling parameters such as the thickness of the silicon oxide and silicon nitride layers, the composite substrate achieves effective CTE matching that improves epitaxial layer uniformity. This parameter optimization is achieved through systematic design rather than trial-and-error, keeping the structure complexity manageable.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The engineered substrate structure improves the uniformity and electronic/optical properties of epitaxial layers, prevents impurity diffusion, and simplifies process integration, making it suitable for optical, electronic, and optoelectronic applications.

Implementation Method 1

Encapsulating layers utilized as components of the engineered substrate structure block diffusion of impurities present in central portions of the substrate from reaching the semiconductor processing environment

Methodology Applied
Scientific EffectDiffusion barrier: Diffusion Barrier

Implementation Method 2

forming an epitaxial silicon layer by epitaxial growth on the substantially single crystalline silicon layer, and forming an epitaxial III-V layer by epitaxial growth on the epitaxial silicon layer

Methodology Applied
Scientific EffectEpitaxial growth: Epitaxy

Data Source

PatentUS20250132152A1Engineered substrate structures for power and RF applications
Publication Date: 2025.04.24 QROMIS INC
  • US20250132152A1 patent drawing
  • US20250132152A1 patent drawing
  • US20250132152A1 patent drawing

AI summary

A method of manufacturing a substrate includes forming a support structure by providing a polycrystalline ceramic core, forming a first adhesion layer coupled to the polycrystalline ceramic core, forming a conductive layer coupled to the first adhesion layer, forming a second adhesion layer coupled to the conductive layer, and forming a barrier layer coupled to the second adhesion layer. The method also includes forming a bonding layer coupled to the support structure, joining a substantially single crystal layer to the bonding layer, wherein the substantially single crystal layer comprises at least one of silicon carbide, sapphire, or gallium nitride, and forming one or more epitaxial III-V layers coupled to the substantially single crystal layer.