Cerium-Based Substrate Cleaning Method for Transition Metal Removal
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Solution Overview
Problem
The existing methods for removing transition metal-containing substances from semiconductor substrates are inefficient, leading to excessive cerium impurities remaining on the substrate surface, which can adversely affect semiconductor device performance.
Innovation Solution
A method involving a chemical solution with a cerium compound and a pH adjuster, followed by a rinsing treatment using specific solutions, effectively removes transition metal-containing substances while minimizing cerium retention on the substrate surface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a chemical solution containing cerium compound is used to remove transition metal-containing substances, then removal efficiency is improved, but cerium impurities remain on the substrate surface
Solution Approach 1:
The treatment process is divided into two distinct steps: Step A uses a chemical solution containing cerium compound to remove transition metal-containing substances, and Step B uses a rinsing solution to remove cerium impurities. This segmentation allows each step to optimize for its specific function without compromising the other.
Solution Approach 2:
The invention extracts and removes the harmful cerium impurities that remain after the removal process. By introducing a rinsing solution in Step B, the cerium residues are selectively extracted from the substrate surface, resolving the contradiction between removal efficiency and impurity levels.
2Manufacturing precision
If existing removal methods are used, then transition metal-containing substances are removed, but the removal efficiency is insufficient
Solution Approach 1:
The invention changes the chemical parameters of the treatment solution by using a cerium compound as the active ingredient and controlling the pH with specific pH adjusters. This parameter change enables highly efficient removal of transition metal-containing substances while allowing for subsequent cerium removal through rinsing.
3Productivity
If cerium compound is used for removal, then removal efficiency increases, but cerium retention on substrate increases
Solution Approach 1:
The rinsing solution acts as an intermediary substance that mediates between the cerium-based removal process and the final substrate cleanliness. It facilitates the removal of cerium impurities without interfering with the effectiveness of the transition metal removal process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-efficiency removal of transition metal-containing substances while ensuring low cerium retention, thereby improving semiconductor device performance and manufacturing efficiency.
Implementation Method 1
a step A of removing a transition metal-containing substance on a substrate by using a chemical solution including a cerium compound and one or more pH adjusters
Implementation Method 2
a step B of performing a rinsing treatment on the substrate obtained by the step A by using one or more rinsing solutions
Data Source
AI summary
The present invention provides a method for treating a substrate, which can remove transition metal-containing substances on a substrate with high efficiency while inhibiting cerium from remaining on the surface of the treated substrate. Furthermore, the present invention provides a method for manufacturing a semiconductor device including the method for treating a substrate, and a kit for treating a substrate that is applicable to the method for treating a substrate. The method for treating a substrate according to an embodiment of the present invention includes a step A of removing a transition metal-containing substance on a substrate by using a chemical solution, which includes a cerium compound and one or more pH adjusters selected from the group consisting of nitric acid, perchloric acid, ammonia, and sulfuric acid, for the substrate having the transition metal-containing substance, and a step B of performing a rinsing treatment on the substrate obtained by the step A by using one or more rinsing solutions selected from the group consisting of a solution including hydrogen peroxide and an acidic aqueous solution which is other than hydrofluoric acid, nitric acid, an aqueous perchloric acid solution, an aqueous oxalic acid solution, and a mixed aqueous solution of these and does not include hydrogen peroxide after the step A.

