Channel Simulator for Wireless Device Performance Testing
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Solution Overview
Problem
Current communication device performance tests require disassembling the device, which destroys its integrity and is inefficient, and often necessitate pre-testing antenna patterns, reducing test efficiency and accuracy.
Innovation Solution
A method and apparatus using a channel simulator that simulates a channel with spatial correlation satisfying a specific equation, allowing for performance testing without disassembling the device, by receiving signals, simulating transmission, and sending them to probes in an anechoic chamber, thereby reproducing real channel parameters and eliminating the need for pre-testing antenna patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a conduction test method is used to test a communication device, then the test can be performed with existing equipment, but the shell of the device must be disassembled which destroys the integrity of the device and reduces test efficiency
Solution Approach 1:
The patent replaces the mechanical disassembly approach with an electromagnetic field-based testing method. Instead of physically connecting to device components through disassembly, the system uses channel simulators to generate electromagnetic signals that interact with the device's antenna system intact, thereby maintaining device integrity while enabling performance testing.
Solution Approach 2:
The patent introduces a channel simulator as an intermediary device between the test equipment and the device under test. The channel simulator generates simulated wireless channel conditions and transmits signals through the air interface, allowing the device to be tested in its assembled state without direct physical access to internal components.
2Measurement precision
If antenna pattern measurement is performed in advance, then the test preparation is completed, but it requires additional time and reduces overall test efficiency
Solution Approach 1:
The patent performs preliminary characterization of the device under test by having it transmit known signals during the testing process. The channel simulator captures these signals and uses them to calculate antenna patterns in real-time, eliminating the need for separate pre-testing while maintaining measurement accuracy through the spatial correlation measurement approach.
Solution Approach 2:
The channel simulator serves multiple functions simultaneously: it generates wireless channel conditions for performance testing, captures device transmission signals for antenna pattern measurement, and processes spatial correlation data. This multi-functionality consolidates what were previously separate testing steps into a single integrated process.
3Difficulty of detecting and measuring
If the device is disassembled for testing, then internal components can be accessed for measurement, but the complexity of the testing process increases and efficiency decreases
Solution Approach 1:
The patent extracts the essential testing function from the physical device structure. Instead of accessing internal components through disassembly, the system extracts and measures the electromagnetic radiation characteristics of the intact device's antenna system by analyzing signals transmitted through the wireless channel.
Data Source
AI summary
The embodiments of the present disclosure provide a method and apparatus for device performance test, which relate to the field of communication technology. The method includes receiving a signal sent by a base station simulator; simulating a channel used for transmitting the signal, and performing simulated transmission on the signal based on the simulated channel; and sending the signal after the simulated transmission to respective probe in the anechoic chamber through an output interface connected to the probe, so that the probe radiates the received signal in the anechoic chamber in which the device under test is placed, and performs performance test on the device under test, where each probe is connected to an output interface of the channel simulator. By the solution provided by the embodiments of the present disclosure, the efficiency of device performance test can be improved.