Charge Stripping Means for Ion Detection
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Solution Overview
Problem
Current ion detection methods lack sensitivity and response time, especially when operating under ambient conditions or in aqueous solutions, and are not applicable to most types of spectrometers without compromising detection quality.
Innovation Solution
A device comprising a charge stripping means made of conductive materials like metals, ceramics, or glass, coupled with a detection electrode, generates and detects charged particles using electric fields to neutralize charges, allowing for effective ion detection in various environments, including liquid and air phases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional ion detection methods are used under ambient conditions or in aqueous solutions, then the detection can be performed in these environments, but the sensitivity and response time are insufficient
Solution Approach 1:
The patent introduces a charge stripping means as an intermediary component between the ion source and detection electrode. This mediator strips charges from ions in a controlled manner, enabling detection in ambient conditions while maintaining high sensitivity. The charge stripping means acts as a buffer that transforms the detection mechanism to work effectively across different environments without compromising sensitivity.
2Reliability
If mass spectrometry is used to achieve sensitive and rapid ion analysis, then high sensitivity and response time are achieved, but the measurements cannot be conducted directly under ambient conditions
Solution Approach 1:
The patent extracts the charge detection function from the complex mass spectrometry system and implements it separately using a charge stripping means combined with a simple detection electrode. This separation allows the sensitive detection capability to be maintained while eliminating the requirement for high-vacuum environments, thereby improving operational efficiency and enabling ambient condition measurements.
3Ease of operation
If a simplified detector design is used to improve ease of manufacture and operation, then the device becomes more versatile and easier to operate, but the sensitivity and resolution may be compromised
Solution Approach 1:
The patent changes the fundamental detection parameter from measuring ion current directly to measuring charge stripping events. This parameter change allows the use of a simplified detector structure with lower voltage requirements while maintaining high detection resolution. The charge stripping mechanism transforms the detection principle to achieve both simplicity and precision simultaneously.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables high-sensitivity and rapid ion detection under ambient conditions, maintaining signal quality and resolution, even in harsh environments, by using a charge stripping mechanism that effectively neutralizes ions and prevents them from reaching the detection electrode, thus reducing noise and interference.
Implementation Method 1
a charge stripping means for stripping or neutralizing the charges of the charged particles generated from the sample thereby give rise to signals that correspond to the charge stripping or neutralizing events occurred therein
Implementation Method 2
a detection electrode for detecting the signals
Implementation Method 3
a hollow electrode is coupled to the charge stripping means, and help create an electric field that allows the generated ions to move toward the charge stripping means
Data Source
AI summary
The present invention relates to a device for detecting charged particles (e.g., ions). The device includes components arranged to neutralize or strip the charges of ions generated from a sample material, in which the charge stripping events produce signals that can be detected subsequently by a detector. A method for detecting charged particles generated from a sample material using the device is also provided.