Charged Particle Probe Control for LC-MS Contamination

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Solution Overview

Problem

Liquid chromatograph mass spectrometers face contamination issues due to low-volatility components like denaturants or surfactants in the eluate, leading to clogged probes and reduced measurement sensitivity, requiring time-consuming pretreatments to prevent deposition and contamination.

Innovation Solution

A charged-particle supply control method and device that applies a gasification promoting gas and a predetermined voltage to the probe while introducing the eluate, and uses an interfering gas or suction to prevent the eluate from reaching the charged particle introduction opening during non-target component times, preventing contamination and clogging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the eluate is continuously introduced into the ion transport optical system, then the measurement can be performed without interruption, but the contamination of the ion transport optical system increases

Engineering Contradiction:
Improvemeasurement continuityVSAvoidcontamination of ion transport optical system
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary anti-action by introducing an interfering gas (such as nitrogen or carbon dioxide) into the ion transport optical system before the eluate is introduced. This creates a protective gas barrier that prevents low-volatility components from the eluate from adhering to the lenses and internal surfaces of the mass spectrometer, thereby preventing contamination in advance while allowing continuous measurement

Inventive Principle:
Principle #9Preliminary anti-action

2Object-affected harmful factors

If the voltage to the ESI probe and nebulizer gas supply are stopped during non-target periods, then the contamination is minimized, but the low-volatility components deposit on the probe tip

Engineering Contradiction:
Improvecontamination of mass spectrometerVSAvoiddeposition on probe tip
Core Design Contradiction:
Object-affected harmful factorsVSObject-generated harmful factors

Solution Approach 1:

The patent uses an interfering gas as an intermediary substance that is introduced into the ion transport optical system. This gas acts as a mediator between the eluate and the internal components of the mass spectrometer, allowing the eluate to be present without causing direct contamination to the lenses and surfaces, thus solving both the contamination and deposition problems

Inventive Principle:
Principle #24Intermediary (Mediator)

3Object-affected harmful factors

If the evacuation system is released to clean the ion transport optical system, then the contamination is removed, but the measurement time is lost

Engineering Contradiction:
Improvecontamination levelVSAvoiddowntime for cleaning
Core Design Contradiction:
Object-affected harmful factorsVSLoss of time

Solution Approach 1:

The patent applies preliminary action by continuously introducing the interfering gas during the entire measurement process, including during periods when no target component is being eluted. This preliminary protective measure prevents contamination from accumulating, eliminating the need for subsequent cleaning operations and associated downtime

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents contamination of the charged particle analysis unit, reduces downtime for cleaning, and eliminates the need for special pretreatment of the liquid sample, ensuring stable and continuous operation even with low-volatility components.

Implementation Method 1

supplying a gasification promoting gas for promoting gasification of the eluate

Methodology Applied
Scientific EffectGasification: Evaporation

Implementation Method 2

supplying an interfering gas in a direction intersecting a direction in which the eluate moves toward the charged particle introduction opening

Methodology Applied
Scientific EffectGas flow: Convection

Data Source

PatentUS11709157B2Charged-particle supply control method and device
Publication Date: 2023.07.25 SHIMADZU CORP
  • US11709157B2 patent drawing
  • US11709157B2 patent drawing
  • US11709157B2 patent drawing

AI summary

Provided is a method for introducing into a probe 22 an eluate eluted from a component separation unit 14 that temporally separates components contained in a liquid sample, for obtaining charged particles, and for delivering the charged particles to a charged particle analysis unit 30 provided at a subsequent stage through a charged particle introduction opening 23, comprising steps of: supplying a gasification promoting gas for promoting gasification of the eluate and applying a predetermined charged-particle obtaining voltage to the probe 22 while the eluate is being introduced into the probe 22; and hindering the eluate nebulized by the probe 22 from moving toward the ion introduction opening 2 only in a time period other than a time period in which a target-component containing eluate is introduced into the probe 22.