Charging Member Surface Layer PFVTF Control for Image Graininess

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional charging members in electrophotographic systems suffer from graininess in images due to inadequate control of surface irregularities with larger periods, which affects image quality and resistance to contamination.

Innovation Solution

A charging member comprising an electrically conductive base, an elastic layer, and a surface layer with a controlled PFVTF value of 1.5 or less, achieved by Fourier transforming the surface roughness curve and integrating amplitude intensities in specific periods, reduces graininess by improving surface properties and resistance to contamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If surface irregularities with larger periods are not controlled, then manufacturing is easier, but image quality deteriorates due to graininess

Engineering Contradiction:
Improvesurface irregularity controlVSAvoidimage graininess
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The patent applies parameter changes by introducing the PFVTF (Power Spectral Density Weighted Total Roughness) value as a new quantitative parameter to control surface irregularities. Instead of only controlling traditional roughness parameters like Rz, the patent uses PFVTF to specifically manage the amplitude intensities at different periods through Fourier transformation, thereby reducing image graininess while maintaining manufacturing feasibility.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent transitions from conventional single-dimensional roughness control (Rz, Ra) to multi-dimensional spectral analysis by applying Fourier transformation to the surface roughness curve. This converts the spatial domain roughness profile into frequency domain amplitude intensities at different periods, enabling targeted control of specific wavelength irregularities that cause graininess.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If surface roughness is increased to improve contamination resistance, then contamination resistance improves, but image quality deteriorates due to increased graininess

Engineering Contradiction:
Improvecontamination resistanceVSAvoidimage graininess
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies local quality by differentiating the control approach for different spatial frequencies of surface irregularities. Instead of uniformly controlling all surface roughness, the patent specifically targets and controls the amplitude intensities at periods of 100 μm to 1000 μm (which cause graininess) while allowing other frequency components to contribute to contamination resistance. This selective control enables both image quality and contamination resistance to be optimized simultaneously.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11966172B2Charging member, charging device, process cartridge, and image forming apparatus
Publication Date: 2024.04.23 FUJIFILM BUSINESS INNOVATION CORP
  • US11966172B2 patent drawing
  • US11966172B2 patent drawing
  • US11966172B2 patent drawing

AI summary

A charging member includes: an electrically conductive base; an elastic layer disposed on the electrically conductive base; and a surface layer disposed on the elastic layer. A PFVTF value of a surface of the surface layer is 1.5 or less. The PFVTF value is obtained by Fourier transforming a roughness curve of the surface of the surface layer that is measured in a circumferential direction to thereby obtain amplitude intensities at different periods, multiplying the amplitude intensities at different periods by VTF coefficients at respective periods that are obtained from a visual characteristic VTFL* (f=period) for lightness L* represented by Formula (V) below to thereby obtain corrected amplitude intensities at different periods, and integrating the corrected amplitude intensities in a period range of from 100 μm to 1000 μm inclusive:VTFL*(f)=5.05×(e(−0.843×1×f)−e(−1.454×1×f)).  Formula (V):