Chemical Sensor Array Defect Detection Using Reference Sensors

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Solution Overview

Problem

Chemical sensor arrays used in experiments often go undetected for defects, leading to incorrect data collection during experiments, particularly in nucleic acid sequencing, due to issues with column and row circuits.

Innovation Solution

Incorporating reference sensors within the array that can be tested by applying bias voltages to determine if they are in a known state, allowing for the identification of defects before an experiment, using a controller to acquire output signals and determine if they correspond to the expected state.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If chemical sensor arrays are used without prior defect detection, then experimental productivity is maintained, but data reliability deteriorates due to undetected defects in column and row circuits

Engineering Contradiction:
Improvedata reliabilityVSAvoidexperimental productivity
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent implements a preliminary defect detection step before conducting the actual chemical sensing experiment. The controller automatically tests each sensor element in the array by applying test signals and checking for proper response, identifying defective sensors prior to experimental use. This preliminary action ensures data reliability without significantly impacting overall productivity, as the detection process is integrated into the experimental workflow.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If reference sensors are added to the sensor array for defect detection, then reliability of sensor array improves, but device complexity increases

Engineering Contradiction:
Improvesensor array reliabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The reference sensors included in the array serve dual purposes: they function as normal chemical sensing elements during experiments and simultaneously serve as test indicators for detecting defects in column and row circuits. By making the reference sensors multi-functional, the patent improves reliability without adding separate dedicated test components, thus limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of operation

If automatic defect detection using controller is implemented, then ease of operation improves, but device complexity increases due to additional control circuitry

Engineering Contradiction:
Improveease of operationVSAvoiddevice complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The system implements self-service defect detection where the controller automatically performs testing of sensor elements without requiring manual intervention. The controller applies test signals, monitors responses, and identifies defective sensors autonomously. This automation significantly improves ease of operation, and the control logic is integrated into the existing system architecture, minimizing the increase in overall device complexity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures that only properly functioning sensor arrays are used in experiments, reducing the risk of incorrect data collection and improving the reliability of nucleic acid sequencing by detecting and eliminating defects in the sensor arrays.

Implementation Method 1

Each reference sensor includes a transistor having a control terminal coupled to a reference node. The controller applies a bias voltage to the reference node to place the transistor in a known state. The controller acquires an output signal from the reference sensor in response to the applied bias voltage.

Methodology Applied
Scientific EffectField effect transistor operation:

Data Source

PatentUS10598723B2Method and apparatus for identifying defects in a chemical sensor array
Publication Date: 2020.03.24 LIFE TECHNOLOGIES CORP
  • US10598723B2 patent drawing
  • US10598723B2 patent drawing
  • US10598723B2 patent drawing

AI summary

In one implementation, a method for operating an apparatus is described. The method includes applying a bias voltage to place a transistor of a reference sensor in a known state, the reference sensor in an array of sensors that further includes a chemical sensor coupled to a reaction region for receiving at least one reactant. The method further includes acquiring an output signal from the reference sensor in response to the applied bias voltage, and determining a defect associated with the array if the output signal does not correspond to the known state.