Chip Card Memory Segmentation Against Electrical Disturbance Attacks
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Solution Overview
Problem
Existing countermeasures, such as check programs, are insufficient to protect electronic cards against spatial and spatio-temporal attacks by disturbance of electrical origin, as they can be easily bypassed by determining the precise point of attack and modifying the logical behavior of functional programs.
Innovation Solution
Storing check program codes in memory areas defined to be immune to disturbances of electrical origin, ensuring that the logical behavior of both functional and check programs cannot be modified by such attacks, and implementing duplication and random selection strategies to enhance robustness against repeated attacks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If check programs are stored in the same memory area as functional programs, then the device complexity is reduced, but the reliability is compromised because attacks can modify both programs simultaneously
Solution Approach 1:
The patent divides the memory into distinct memory areas: a first memory area for functional programs and a second memory area for check programs. This segmentation ensures that attacks targeting functional programs cannot simultaneously affect check programs, thereby maintaining reliability while managing device complexity through structured memory organization.
Solution Approach 2:
The patent applies local quality by creating memory areas with different security characteristics. The second memory area storing check programs is specifically designed to be resistant to electrical disturbances that affect the first memory area. This local differentiation in memory properties allows check programs to maintain integrity even when functional programs are compromised.
2Reliability
If check programs are stored in memory areas immune to electrical disturbances, then the reliability is improved, but the device complexity increases due to specialized memory structure requirements
Solution Approach 1:
The patent segments memory into a first area for functional programs and a second area for check programs, where the second area is defined to be immune to electrical disturbances. This segmentation provides reliability through isolation while managing complexity by clearly defining the boundaries and properties of each memory segment.
Solution Approach 2:
The patent introduces a trap program as an intermediary element stored in the second memory area. This trap program serves as a mediator that detects attacks and triggers appropriate responses, thereby enhancing reliability without requiring complete redesign of the memory structure. The trap program acts as a security layer between potential attacks and the check programs.
3Ease of operation
If the same check program is used repeatedly, then the ease of operation is improved, but the reliability decreases against spatio-temporal attacks
Solution Approach 1:
The patent implements dynamics by enabling the selection of different check programs from the second memory area based on detected attack patterns. Instead of using a static, repeated check program, the system dynamically chooses appropriate check programs to counter specific attack types, thereby maintaining ease of operation through automated selection while improving reliability against spatio-temporal attacks.
Solution Approach 2:
The patent incorporates feedback mechanisms where the trap program monitors for attacks and provides information about detected attack patterns. This feedback enables the system to select appropriate check programs from the second memory area, creating a responsive security system that adapts to attack patterns while maintaining operational simplicity through automated decision-making.
Data Source
AI summary
A functional program stored in a memory area of an electronic card may be protected against an attack by disturbance of electrical origin intended to modify at least one logic state of at least one code of this program. The method may include: a storage step during which codes of the functional program and codes of a check program intended to check the logical behavior of the functional program are stored in the memory of the card; and a step of executing at least one code of the functional program followed by a step of checking the logic states of the functional program by executing the check program. During the storage step, the codes of the check program are stored in a memory area formed by addresses that are defined so that the attack by disturbance of electrical origin has no influence on the logic states of this program.