Chip Card Test Handling With Robot Transfer Between Test Positions
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Solution Overview
Problem
Conducting multiple tests on chip cards is time-consuming and requires a large number of personnel due to the manual and sequential nature of existing testing methods.
Innovation Solution
A device and method utilizing a robot arm with a gripper to transfer chip cards between different positions for mechanical and electrical testing, allowing for automated and flexible testing of chip cards in various formats, including a transfer mechanism with adjustable stress points and orientations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual testing methods are used to test chip cards, then testing can be performed with simple equipment, but the testing process is time-consuming and requires a large number of personnel
Solution Approach 1:
The patent replaces manual mechanical operations with an automated robot arm system that performs chip card transfer, positioning, and testing operations. The robot arm with gripper automatically handles chip cards between different test positions, eliminating the need for manual personnel intervention and significantly increasing testing productivity while reducing labor requirements.
Solution Approach 2:
The testing device integrates multiple testing functions into a single automated system. The robot arm can transfer chip cards to different test positions (mechanical testing, electrical testing, optical testing), and the system can perform various test types sequentially or in parallel, making the equipment versatile and capable of comprehensive chip card validation.
2Reliability
If multiple test positions are provided for comprehensive testing, then testing completeness is improved, but the device complexity increases
Solution Approach 1:
The testing device is divided into distinct functional modules, each responsible for a specific test type (mechanical testing module, electrical testing module, optical testing module). The robot arm transfers chip cards between these segmented modules, allowing each module to specialize in its specific test function while maintaining overall system integration and completeness.
Solution Approach 2:
The robot arm acts as an intermediary component that connects and coordinates between different test positions. It automatically transfers chip cards between modules, manages positioning, and sequences test operations, thereby integrating multiple test functions without requiring complex direct interconnections between all test modules.
3Adaptability or versatility
If fixed transfer trajectories are used, then the transfer device is simpler to control, but flexibility in accommodating different chip card formats is reduced
Solution Approach 1:
The robot arm employs dynamic, programmable motion control that allows flexible adjustment of transfer trajectories and positioning parameters. Unlike fixed mechanical guides, the robot arm can adapt its movement paths and gripper positions to accommodate different chip card formats, sizes, and orientations through software control, providing high versatility without requiring multiple fixed transfer mechanisms.
Data Source
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AI summary
The invention relates to a device (1) for testing a chip card (2), comprising a holding device (5) for providing the chip card (2) in a first test position (6) for performing a mechanical test, and a second test position (7) for performing an electrical test. A transfer device (8) is provided, configured to transfer the chip card (2) directly or indirectly to the holding device (5) from at least two different starting positions. The invention further relates to a method for testing a chip card (2).