Elastic Snap Ring Chip Carrier for Multi-Size Test Fixturing
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Solution Overview
Problem
The existing methods for testing chip package bodies are inefficient due to the need for multiple test devices to accommodate different sizes and types of chips, leading to resource wastage and increased costs.
Innovation Solution
A device using a support box with elastic snap rings that can securely fasten chips of various sizes and shapes to a test circuit board, allowing for universal testing without the need for multiple devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple test devices are provided for various types of chip package bodies, then testing coverage for different chip sizes and types is improved, but device complexity and resource consumption increase
Solution Approach 1:
The patent implements a universal test device that can accommodate different types and sizes of chip package bodies through a standardized support box design with adjustable positioning structures. The support box includes a base plate with positioning holes and adjustable positioning blocks that can be configured to match various chip dimensions, allowing a single test device to perform multiple testing functions rather than requiring separate dedicated devices for each chip type.
Solution Approach 2:
The test device is divided into modular components including a standardized support box, adjustable positioning blocks, and interchangeable test probes. This segmentation allows the positioning structures to be adjusted or reconfigured for different chip types while maintaining the integrity of the main test device, enabling versatility without requiring complete device replacement.
2Adaptability or versatility
If multiple test devices are provided for various types of chip package bodies, then testing coverage for different chip sizes and types is improved, but resource waste and test costs increase
Solution Approach 1:
The standardized support box design with adjustable positioning structures enables a single test device to serve multiple chip types and sizes, eliminating the need to manufacture, deploy, and maintain multiple dedicated test devices. This universal approach reduces resource consumption in device production, space requirements for device storage, and overall testing infrastructure costs while maintaining comprehensive testing coverage.
3Adaptability or versatility
If a standardized support box with elastic snap rings is used to fasten chips, then adaptability to different chip sizes is improved, but fastening force control becomes more complex
Solution Approach 1:
The elastic snap rings utilize material elasticity parameters to provide adaptive fastening force. The elastic deformation characteristics of the snap rings allow them to automatically adjust the fastening force based on the chip size and position, eliminating the need for complex adjustable fastening mechanisms while maintaining secure attachment across different chip dimensions.
Solution Approach 2:
The elastic snap rings automatically adjust and maintain appropriate fastening force through their inherent elastic properties without requiring external control systems or complex adjustment mechanisms. The snap rings self-regulate the fastening pressure based on the chip dimensions and position, providing adaptive securing while simplifying the overall fastening mechanism design.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and cost-effective testing of different types, shapes, and volumes of chips by providing a secure and stable connection for the chip, reducing the need for multiple test devices and improving testing efficiency.
Implementation Method 1
a second connection terminal of the first elastic snap ring...provide a pressure in a first direction for the chip because an elastic body of the first elastic snap ring is in an elastically compressed state
Data Source
AI summary
The present disclosure relates to a device for carrying a chip, and a device and a method for testing a chip. The device for carrying a chip is configured to fasten chips of different sizes, and includes a support box and a plurality of first elastic snap rings. The support box is configured to carry a chip. A first connection terminal of the first elastic snap ring is provided on a first inner side wall of the support box, a second connection terminal of the first elastic snap ring is suspended, and is configured to be in contact with the chip and provide a pressure in a first direction for the chip because an elastic body of the first elastic snap ring is in an elastically compressed state.