Chip Guide Maintenance Opening for Wear Part Replacement

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Solution Overview

Problem

The maintenance effort for chip discharge and comminution apparatuses is high due to the sharp edges and high temperature of the chips, requiring frequent maintenance and replacement of wear parts, especially when clogging occurs.

Innovation Solution

Incorporating a maintenance opening in the guide channel with a closable flap and using a replacement module for the severing element, allowing for simplified maintenance and replacement of wear parts, and utilizing a temperature-resistant and wear-resistant material for the guide channel.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a guide channel circumferentially surrounds the chip path to protect against injuries from sharp and hot chips, then safety is improved, but maintenance effort increases due to difficulty in accessing the interior of the guide channel

Engineering Contradiction:
Improveprotection against injuries from sharp and hot chipsVSAvoidmaintenance effort for guide channel
Core Design Contradiction:
Object-affected harmful factorsVSEase of repair

Solution Approach 1:

The guide channel is segmented by introducing a maintenance opening that divides the otherwise enclosed structure into accessible and protected zones. This segmentation allows the interior to remain enclosed for safety while providing a specific access point for maintenance activities without compromising the overall protective function.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The maintenance opening acts as an intermediary element between the external maintenance environment and the enclosed guide channel interior. It mediates the contradiction by allowing maintenance access while maintaining the protective enclosure, essentially serving as a controlled interface that resolves the conflict between safety and maintainability.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If regular maintenance is performed to address clogging and wear from sharp, hot chips, then reliability is maintained, but productivity decreases due to frequent shutdowns

Engineering Contradiction:
Improvereliability of chip discharge and comminution apparatusVSAvoidproductivity during maintenance periods
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The maintenance opening enables preliminary maintenance actions to be taken more efficiently. By providing direct access to the guide channel interior, maintenance personnel can perform inspections, clear clogs, and replace wear parts before failures occur, reducing the frequency and duration of shutdowns while maintaining reliability.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The design enables faster self-service maintenance by allowing quick access to critical components. The maintenance opening facilitates rapid clearing of clogs and replacement of wear parts without requiring extensive disassembly, enabling the system to restore operational capacity more quickly and minimize productivity loss.

Inventive Principle:
Principle #25Self-service

3Duration of action of stationary object

If the guide channel is made from temperature-resistant and wear-resistant material to withstand hot chips with sharp edges, then durability is improved, but manufacturing cost increases

Engineering Contradiction:
Improvedurability of guide channelVSAvoidmanufacturing cost of guide channel
Core Design Contradiction:
Duration of action of stationary objectVSEase of manufacture

Solution Approach 1:

Instead of making the entire guide channel from expensive temperature-resistant and wear-resistant material, the maintenance opening allows for localized application of such materials only in areas subject to direct chip contact and wear. This local quality approach maintains durability where needed while reducing overall manufacturing costs by using less expensive materials in non-critical areas.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS10022829B2Apparatus and method for discharge and comminution of a chip
Publication Date: 2018.07.17 SMS GROUP GMBH
  • US10022829B2 patent drawing
  • US10022829B2 patent drawing
  • US10022829B2 patent drawing

AI summary

In order to minimize the maintenance effort that accompanies discharge and comminution of a chip, an apparatus for discharge and comminution of a chip has a chip guide and a comminution apparatus, to which the chip guide guides the chip along a chip path. The chip guide has a guide channel that circumferentially surrounds the chip path having a channel inlet and a channel outlet, wherein the guide channel has a maintenance opening in addition to the channel inlet and the channel outlet. Furthermore, a method for discharge and comminution of a chip for this purpose services the guide channel by way of the maintenance opening after discharge and comminution of a chip having a predetermined chip length.