Chip Package Shallow Recess for Wire Bonding

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional chip packages with sensing functions, such as fingerprint-recognition chips, face challenges due to the thickness of the encapsulant layer, which affects sensitivity and can lead to short or broken circuits during the bonding process, preventing the formation of a flat surface.

Innovation Solution

A chip package design featuring a shallow recess structure outside the signal pad region, with a redistribution layer connected to the signal pad and a wire bonded to the redistribution layer within the recess, allowing for reduced encapsulant layer thickness and improved sensitivity while maintaining structural strength.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If wires are bonded from contact pad region to printed circuit board, then electrical connection is established, but encapsulant layer thickness increases and sensitivity decreases

Engineering Contradiction:
Improveelectrical connectionVSAvoidsensitivity
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent moves the wire bonding location from the upper surface (contact pad region) to the side surface of the chip, utilizing the vertical dimension. This allows wires to be bonded at a lower height relative to the upper surface, enabling thinner encapsulant layers while maintaining electrical connection reliability.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent introduces a shallow recess structure as an intermediary feature on the chip surface. This recess provides a dedicated location for wire bonding that is lower than the contact pad region, acting as a mediator between the electrical connection requirement and the sensitivity requirement.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If wires are bonded adjacent to chip edges, then electrical connection is achieved, but short circuit or broken circuit risk increases

Engineering Contradiction:
Improveelectrical connectionVSAvoidshort circuit risk
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent creates a localized shallow recess structure with specific geometric properties (depth, width, positioning) that differs from the surrounding chip surface. This local modification provides a protected environment for wire bonding, isolating the wires from harmful contact with chip edges while maintaining electrical connectivity.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If encapsulant layer thickness is reduced, then sensitivity improves, but wire bonding becomes more difficult

Engineering Contradiction:
ImprovesensitivityVSAvoidwire bonding
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The shallow recess structure is formed on the chip surface before wire bonding takes place. This preliminary preparation creates a pre-positioned, protected location for wire placement, making the subsequent wire bonding process easier and more reliable even when the overall encapsulant layer is thin.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9425134B2Chip package
Publication Date: 2016.08.23 XINTEC INC
  • US9425134B2 patent drawing
  • US9425134B2 patent drawing
  • US9425134B2 patent drawing

AI summary

A chip package is provided. The chip package includes a chip having an upper surface, a lower surface and a sidewall. The chip includes a sensing region or device region and a signal pad region adjacent to the upper surface. A shallow recess structure is located outside of the signal pad region and extends from the upper surface toward the lower surface along the sidewall. The shallow recess structure has at least a first recess and a second recess under the first recess. A redistribution layer is electrically connected to the signal pad region and extends into the shallow recess structure. A first end of a wire is located in the shallow recess structure and is electrically connected to the redistribution layer. A second end of the wire is used for external electrical connection. A method for forming the chip package is also provided.