Wafer-Level Chip Package With Support Layer

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Solution Overview

Problem

The miniaturization of electronic products requires improved chip package technology to handle scaled-down chips without damaging them during the packaging process.

Innovation Solution

A chip package is formed using a semiconductor substrate with a dielectric layer, conducting pad structures, a support layer, and a protection layer, where the substrate is thinned and processed to create separate chip packages using a wafer-level package process, including scribing, bonding, and cutting, to minimize damage and reduce manufacturing costs and time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If chips are scaled down to meet miniaturization requirements, then electronic product size is reduced, but chip structural strength decreases making them more susceptible to damage during packaging

Engineering Contradiction:
Improvechip sizeVSAvoidchip structural strength
Core Design Contradiction:
Volume of moving objectVSStrength

Solution Approach 1:

The patent applies preliminary action by forming a support layer on the chip surface before the thinning process. This support layer provides structural reinforcement during subsequent processing steps, preventing chip damage while enabling the final miniaturized thickness to be achieved. The support layer is temporarily present during critical operations and then removed after packaging is complete.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent employs parameter changes by temporarily modifying the chip's structural parameters during processing. The support layer changes the mechanical properties and thickness parameters of the chip during packaging operations, allowing thin chips to be handled with the structural integrity of thicker chips. After packaging, the support layer is removed and parameters return to the final miniaturized state.

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If conventional packaging processes are used on scaled-down chips, then existing manufacturing capabilities are maintained, but chip damage occurs during processing

Engineering Contradiction:
Improvemanufacturing process compatibilityVSAvoidchip integrity during processing
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The support layer acts as an intermediary element between the chip and the packaging process. It mediates the interaction between conventional packaging equipment and fragile miniaturized chips, providing the necessary structural support during handling, bonding, and cutting operations without requiring modification of existing manufacturing processes.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If wafer-level packaging is implemented to reduce costs and time, then manufacturing efficiency is improved, but new process steps are required that increase process complexity

Engineering Contradiction:
Improvemanufacturing efficiencyVSAvoidprocess steps
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the packaging process into distinct phases: support layer formation, wafer-level processing, and support layer removal. This segmentation allows each phase to be optimized independently while maintaining overall process efficiency. The support layer enables wafer-level processing of multiple chips simultaneously, dramatically improving productivity despite the additional process steps.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9006896B2Chip package and method for forming the same
Publication Date: 2015.04.14 XINTEC INC
  • US9006896B2 patent drawing
  • US9006896B2 patent drawing
  • US9006896B2 patent drawing

AI summary

An embodiment of the invention provides a chip package which includes: a semiconductor substrate having a first surface and a second surface; a device region formed in the semiconductor substrate; a dielectric layer disposed on the first surface of the semiconductor substrate; a conducting pad structure located in the dielectric layer and electrically connected to the device region, wherein the conducting pad structure comprises a stacked structure of a plurality of conducting pad layers; a support layer disposed on a top surface of the conducting pad structure; and a protection layer disposed on the second surface of the semiconductor substrate.