Chip Pad Test Coverage via Control Unit Mediator
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Solution Overview
Problem
Existing chip probing tests cannot effectively cover all pads and off-chip units, failing to determine the functionality and leakage conditions of pads not coupled to the probe.
Innovation Solution
A chip with a control unit, multiple pads, and a storage unit, where the control unit controls a pad not coupled to the probe to read and write predetermined data to specific blocks, allowing the test machine to assess the pad's functionality and leakage conditions by reading the stored data through a coupled pad.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a probe is coupled to a predetermined pad to perform chip probing test, then the data path circuit and storage unit can be tested, but other pads not coupled to the probe cannot be tested for functionality and leakage conditions
Solution Approach 1:
The patent introduces an intermediary mechanism where the control unit acts as a mediator between the probe and the pads not coupled to the probe. The control unit enables indirect testing by controlling the pad to read/write data to storage blocks, allowing the probe to test the pad's functionality and leakage conditions without direct coupling. This resolves the contradiction by enabling comprehensive pad testing while maintaining the existing probe coupling configuration.
Solution Approach 2:
The patent applies the self-service principle by enabling the pad itself to perform testing operations through the control unit. The pad reads data from and writes data to storage blocks autonomously under control unit coordination, allowing it to self-test its functionality and leakage conditions. This eliminates the need for direct probe coupling to each pad while maintaining comprehensive test coverage.
2Reliability
If traditional probe coupling method is used, then the test setup is simple, but the test coverage is incomplete for pads not coupled to the probe
Solution Approach 1:
The patent applies universality by enabling the control unit to serve multiple functions: it coordinates probe coupling, controls data reading/writing operations, and enables leakage testing for all pads including those not directly coupled to the probe. This multi-functional approach maintains operational simplicity while achieving comprehensive pad testing coverage.
Solution Approach 2:
The patent applies preliminary action by having the control unit prepare test data and configure the storage blocks before the actual testing begins. The system pre-establishes the testing framework and data structures, allowing subsequent pad testing operations to proceed smoothly without complex real-time configuration, thus maintaining ease of operation.
3Reliability
If all pads are tested through direct probe coupling, then complete test coverage is achieved, but the test time and resource consumption increase significantly
Solution Approach 1:
The control unit serves as an intermediary that enables efficient indirect testing of multiple pads through a single probe coupling point. By coordinating data reading and writing operations through the control unit, the system can test multiple pads sequentially without requiring direct probe coupling to each one, significantly reducing test time while maintaining comprehensive coverage.
Solution Approach 2:
The patent applies continuity of useful action by enabling the pad to continuously perform reading and writing operations to storage blocks under control unit coordination. This continuous operation allows multiple pads to be tested in sequence without interruption or idle time, maximizing testing efficiency and minimizing total test duration while achieving complete pad coverage.
Data Source
AI summary
A method for improving test coverage of pads of a chip, where the chip includes a control unit, a plurality of pads, and a storage unit, and the storage unit includes a plurality of blocks, includes writing test data to a first predetermined block through a predetermined pad of the plurality of pads, controlling a first pad to read and store a predetermined datum of the test data from the first predetermined block, controlling the first pad to write the predetermined datum to a second predetermined block, reading the predetermined datum stored in the second predetermined block through the predetermined pad, and determining whether the first pad is passed.