Chip Probing Wafer Map Generation via Color-Coded Bin Mapping
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Solution Overview
Problem
Existing methods for generating chip probing wafer maps are resource-intensive and time-consuming, particularly when dealing with large datasets, as they require frequent database access and redrawn maps for even minor changes, leading to prolonged waiting times and excessive storage usage.
Innovation Solution
A method that involves obtaining test data from a wafer, assigning predetermined color codes to bin numbers, and generating a general chip probing wafer map, which can be stored efficiently in a common image format, allowing for simple processing to produce single, composite, or bin-grouping maps as needed, reducing computational resources and storage requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If CP maps are drawn using scheduling technique and stored in database, then maps are available for review, but storage space is occupied and redraw is required for any changes
Solution Approach 1:
The patent uses image files as copies of the CP map visual representation, storing only the final graphical output rather than the complete processed data. This allows multiple views to be generated from a single image file, dramatically reducing storage requirements while maintaining map availability for review.
Solution Approach 2:
The system performs preliminary processing by generating the CP map image file in advance from the test data, so that the visual representation is ready for immediate review without requiring real-time data processing during user access.
2Adaptability or versatility
If multiple bin-grouping maps are generated and stored, then different product definitions are supported, but storage space increases significantly
Solution Approach 1:
The system creates a universal image file that can serve multiple purposes - it can be viewed as-is or processed further to generate different bin-grouping maps according to various product definitions. This single image file replaces the need to store multiple separate map files for different product configurations.
Solution Approach 2:
The patent separates the data processing into stages: first generating a base image file from test data, then applying different bin-grouping configurations as post-processing steps. This segmentation allows the same base image to support multiple product definitions without duplicating storage.
3Loss of information
If CP maps are redrawn for parameter changes or new maps, then updated information is provided, but system time and resources are consumed
Solution Approach 1:
The system performs the computationally intensive data processing and map generation in advance, creating a ready-to-use image file. This preliminary action eliminates the need for time-consuming redraw operations when users need to view or analyze the maps.
4Speed
If real-time CP map access is implemented, then maps are generated quickly, but system resources are heavily consumed for large datasets
Solution Approach 1:
The patent performs the resource-intensive processing of large test datasets in advance, generating the CP map image file before user access is needed. This shifts the resource consumption to an earlier time when system resources are available, providing fast access during user review without heavy resource demands.
Data Source
AI summary
Provided is a method for generating a chip probing wafer map, and the method includes: obtaining test data associated with a first chip, wherein the first chip includes a plurality of sequentially arranged first dies, and each of the first dies belongs to one of a plurality of bin numbers; assigning different predetermined color codes to the bin numbers; and generating a first general chip probing wafer map for the first chip by assigning a color code of each of the first dies as a corresponding predetermined color code according to the bin number to which each of the first dies belongs.