Chip Radiation Attack Detection Using RS Latch and Substrate Contact
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current security measures for chips used in security-critical applications, such as chip cards and security controllers, are inadequate in detecting radiation attacks, particularly local failures on small circuit blocks, and fail to trigger timely alarm signals to initiate protection mechanisms.
Innovation Solution
The implementation of a chip with a substrate region and an RS latch having complementary nodes, a control circuit connecting one node to a supply potential based on the control input, and an output circuit triggering an alarm based on the storage state of the RS latch, along with field effect transistors that connect substrate regions to supply terminals to amplify radiation-induced effects, enhancing detection sensitivity and triggering an alarm upon radiation attacks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional security measures are used for chip protection, then basic security is maintained, but detection of radiation attacks is inadequate and alarm triggering is delayed
Solution Approach 1:
The detection circuit is nested within the existing chip substrate structure, utilizing the substrate contact and integrated circuit components already present in the chip. The RS latch and control circuit are embedded within the substrate region, allowing detection functionality to be incorporated without adding separate external detection devices, thus improving reliability while controlling complexity.
Solution Approach 2:
The substrate contact serves as an intermediary element that connects the radiation detection function to the existing chip structure. By using the substrate contact as a control input for the RS latch, the invention mediates between the physical substrate and the logical detection circuitry, enabling radiation attack detection without requiring a completely new detection system.
2Measurement precision
If the substrate contact is used as control input for the RS latch, then radiation attack detection sensitivity is improved, but the circuit complexity increases
Solution Approach 1:
The substrate contact serves multiple functions: it provides structural support for the integrated circuit, establishes electrical connections within the chip, and simultaneously acts as the control input for the RS latch in the detection circuit. This multi-functionality allows the same physical element to contribute to both the chip's operational functionality and the radiation detection capability, improving sensitivity without proportionally increasing complexity.
Solution Approach 2:
The detection circuit utilizes existing chip components and structures to perform the detection function. The RS latch uses the substrate contact potential directly, and the control circuit leverages the existing power supply and logic circuitry within the chip. This self-service approach allows the chip to detect radiation attacks using its own internal resources, improving detection sensitivity while minimizing the addition of external complexity.
3Reliability
If field effect transistors are used to connect substrate regions to supply terminals, then radiation-induced effects are amplified, but power consumption increases
Solution Approach 1:
The field effect transistors are configured to automatically activate when radiation-induced potential changes occur in the substrate regions. The transistors are pre-positioned with their gates connected to the substrate regions, so that when radiation attacks cause potential shifts, the transistors immediately respond by connecting the substrate regions to the supply terminals. This preliminary configuration allows rapid response to radiation events without requiring continuous power consumption for active monitoring.
Solution Approach 2:
The detection mechanism operates in a periodic or event-driven manner rather than continuously. The field effect transistors remain in a low-power state until radiation-induced potential changes trigger them to activate. Once triggered, they amplify the radiation effects by connecting substrate regions to supply terminals, then return to a lower power state. This periodic activation pattern reduces overall power consumption while maintaining reliable protection capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution significantly improves the detection probability of radiation attacks, ensuring timely alarm triggering and enhanced protection mechanisms, even for small circuit blocks, by amplifying radiation-induced effects and reducing false alarms.
Implementation Method 1
a field effect transistor, the gate of which is connected to the first doped substrate region and is configured to connect the second substrate region to a supply terminal depending on the potential of the first substrate region
Implementation Method 2
an RS latch having two complementary nodes representing a storage state of the RS latch
Data Source
AI summary
A chip having a substrate region having a substrate contact, an RS latch having two complementary nodes representing a storage state of the RS latch, a control circuit having a control input and configured to connect one of the complementary nodes to a supply potential depending on a potential at the control input, wherein the control input is connected to the substrate contact, and an output circuit connected to an output of the RS latch and configured to trigger an alarm depending on the storage state of the RS latch.