Chip Resistor Back Electrode Insulating Resin Layer

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Solution Overview

Problem

Chip resistors experience solder burst and adhesion deterioration due to outgas from electrically conductive resin back electrodes during heating, and thermal stress causes cracks along the boundary between the back electrodes and the ceramic substrate, especially when the back electrodes are made of sintered silver with limited step height.

Innovation Solution

The chip resistor features a ceramic substrate with back electrodes covered by insulating resin layers that expose their edge portions from external electrodes, preventing outgas from soldering and enhancing solder bonding thickness, while also protecting against thermal stress-induced cracks by overlapping the resin layers with the back electrodes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Stress or pressure

If the back electrodes are made of electrically conductive resin to relax thermal stress, then thermal stress relaxation is improved, but outgas is generated during solder bonding causing solder burst and adhesion deterioration

Engineering Contradiction:
Improvethermal stressVSAvoidoutgas
Core Design Contradiction:
Stress or pressureVSObject-generated harmful factors

Solution Approach 1:

The back electrode is divided into two distinct layers: a lower layer made of sintered silver and an upper layer made of electrically conductive resin. This segmentation allows each layer to perform its specific function - the sintered silver provides thermal stress relaxation and outgas resistance, while the conductive resin provides electrical conductivity and solder wettability. The layered structure resolves the contradiction by separating the conflicting material requirements into different spatial zones.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The back electrode uses a composite structure combining sintered silver and electrically conductive resin in a laminated configuration. This composite material approach leverages the complementary properties of both materials - the metallic sintered silver for mechanical stability and outgas resistance, and the resin-based conductive material for electrical performance and solder bonding. The composite structure enables simultaneous achievement of thermal stress relaxation and outgas prevention.

Inventive Principle:
Principle #40Composite materials

2Object-generated harmful factors

If both electrode layers are made of sintered silver to prevent outgas, then outgas generation is eliminated, but it is difficult to form thick film and step height is limited to very small values

Engineering Contradiction:
ImproveoutgasVSAvoidstep height
Core Design Contradiction:
Object-generated harmful factorsVSLength of stationary object

Solution Approach 1:

The electrode structure is segmented into functional layers where the sintered silver layer provides the necessary step height and outgas resistance, while the conductive resin layer provides electrical conductivity without limiting the overall step height. This segmentation allows the sintered silver layer to be formed with sufficient thickness for mechanical support and stress relaxation, while the resin layer adds electrical functionality without constraining the dimensional requirements.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention changes the material parameter of the upper electrode layer from sintered silver to electrically conductive resin. This parameter change allows for greater flexibility in achieving required step heights, as the resin layer can be formed with controlled thickness independent of the sintering process constraints. The resin material can be deposited to achieve the necessary dimensional parameters without the limitations of sintered silver formation processes.

Inventive Principle:
Principle #35Parameter changes

3Strength

If the first electrode layer is made of sintered silver for excellent tight adhesion to ceramic substrate, then adhesion is improved, but thermal stress causes cracks along the boundary between the electrode and substrate

Engineering Contradiction:
ImproveadhesionVSAvoidcrack resistance
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The back electrode is segmented into a lower sintered silver layer for strong adhesion to the ceramic substrate and an upper conductive resin layer for stress distribution. This segmentation allows the sintered silver to maintain excellent bond strength with the substrate while the resin layer acts as a stress-absorbing intermediate that prevents crack propagation along the substrate interface.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The conductive resin layer serves as a pre-positioned cushioning layer between the rigid sintered silver electrode and the ceramic substrate. This resin layer absorbs and distributes thermal stresses before they can concentrate at the substrate-electrode boundary, preventing crack formation in advance. The softer resin material accommodates thermal expansion differences, cushioning the interface against stress-induced damage.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration prevents solder burst, maintains firm adhesion, and effectively prevents cracks and fractures in the solder bonding portions due to thermal stress, ensuring reliable chip resistor mounting.

Implementation Method 1

outgas is generated from resin contents of the back electrodes by heating during the solder bonding

Methodology Applied
Scientific EffectOutgas:

Implementation Method 2

each of back electrodes is formed into a two-layer structure consisting of an inner layer made of sintered silver

Methodology Applied
Scientific EffectSintering: Sintering

Implementation Method 3

The pair of external electrodes are formed by plating treatment applied to external surfaces of the end-surface electrodes

Methodology Applied
Scientific EffectPlating treatment: Electroplating

Data Source

PatentUS10192659B2Chip resistor
Publication Date: 2019.01.29 KOA CORP
  • US10192659B2 patent drawing
  • US10192659B2 patent drawing
  • US10192659B2 patent drawing

AI summary

Provided is a chip resistor in which cracks, fracture, etc. can be surely prevented from occurring due to thermal stress in solder bonding portions. The chip resistor 1 includes: a ceramic substrate 2 that is shaped like a cuboid; a pair of front electrodes 3 that are provided on lengthwise opposite end portions of a front surface of the ceramic substrate 2; a resistor body 4 that is provided between and connected to the two front electrodes 3; a protective layer 5 that covers the resistor body 4; a pair of back electrodes 6 that are provided on lengthwise opposite end portions of a back surface of the ceramic substrate 2; end-surface electrodes 7 through which the front electrodes 3 and the back electrodes 6 are electrically conductively connected to each other respectively; external electrodes 8 that cover the end-surface electrodes 7; and a pair of insulating resin layers 9 that are provided to cover edge portions of the back electrodes 6; wherein: the pair of insulating resin layers 9 are opposed to each other with interposition of a predetermined interval therebetween on the back surface of the ceramic substrate 2; and at least opposed side end portions of the insulating resin layers 9 are exposed from the external electrodes 8.