Carrier-Protected Chip Scale Package for Heat Dissipation

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Solution Overview

Problem

Conventional six-sided protected chip scale package (CSP) semiconductor devices face challenges in efficiently dissipating heat generated by power semiconductor devices while maintaining structural compactness and protecting the device from environmental factors.

Innovation Solution

The semiconductor device incorporates a carrier with an exposed first major surface through the moulding material, allowing for improved heat dissipation and structural integrity by acting as a heat sink, while the carrier's recessed design accommodates the semiconductor die and adhesive, reducing overall package height.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If mould material covers all six sides of the semiconductor die, then the device is protected from environmental factors, but heat dissipation is compromised

Engineering Contradiction:
Improveprotection from environmental factorsVSAvoidheat dissipation
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

The mould material coverage is segmented rather than complete - it covers five sides of the carrier but deliberately leaves the first major surface exposed. This partial coverage segmentation allows the device to gain environmental protection where needed while maintaining heat dissipation capability at the exposed surface.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the device are given different levels of protection: the carrier body and semiconductor die are protected by mould material on five sides, while the first major surface of the carrier is left exposed with enhanced heat dissipation properties. This local differentiation allows simultaneous achievement of protection and heat dissipation.

Inventive Principle:
Principle #3Local quality

2Length of stationary object

If the carrier recess is designed to receive adhesive and semiconductor die, then package height is reduced, but manufacturing precision requirements increase

Engineering Contradiction:
Improvepackage heightVSAvoidadhesive placement precision
Core Design Contradiction:
Length of stationary objectVSManufacturing precision

Solution Approach 1:

The carrier recess is pre-formed with specific dimensions and geometry before adhesive application. This preliminary structuring of the recess provides natural alignment features and depth control that guide adhesive placement, reducing the actual manufacturing precision required during the bonding process.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The carrier recess acts as an intermediary structure that mediates between the adhesive layer and the semiconductor die. It provides a controlled interface that accommodates adhesive variation and ensures consistent bonding, thereby reducing the precision requirements for adhesive application while maintaining compact package height.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides enhanced heat dissipation and structural integrity without increasing the package height, making it suitable for high power transistor devices and harsh environments.

Implementation Method 1

an adhesive layer is arranged in the recess for mounting the semiconductor die to the carrier

Methodology Applied
Scientific EffectAdhesion: Adhesive

Implementation Method 2

a moulding material partially encapsulating the semiconductor die and the carrier

Methodology Applied
Scientific EffectPhysical containment: Physical Containment

Data Source

PatentEP3503177B1Carrier protected chip scale package and method of manufacturing thereof
Publication Date: 2025.07.09 NEXPERIA BV
  • EP3503177B1 patent drawingFigure 1
  • EP3503177B1 patent drawingFigure 2a
  • EP3503177B1 patent drawingFigure 2b~2d

AI summary

The present disclosure relates to a semiconductor device and a method of manufacturing a semiconductor device. In particular the disclosure relates to chip scale package semiconductor device, comprising; a semiconductor die having a first major surface and an opposing second major surface, the semiconductor die comprising at least two terminals arranged on the second major surface; a carrier comprising a first major surface and an opposing second major surface, wherein the first major surface of the semiconductor die is mounted on the opposing second major surface of the carrier; and a moulding material partially encapsulating the semiconductor die and the carrier, wherein the first major surface of the carrier extends and is exposed through moulding material, and the at least two terminals are exposed through moulding material on a second side of the device.