Chip Temperature Prediction With Pre-Operation Frequency Control

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Solution Overview

Problem

Existing memory devices face challenges in maintaining reliable operation at high temperatures, particularly when sudden power off occurs, leading to undesirable device operation issues due to inadequate temperature management.

Innovation Solution

Implementing a method using supervised machine learning to predict temperature rises in electronic devices by training an artificial neural network with input parameters such as battery level, current time, memory usage, and charging status, allowing for proactive temperature management through frequency reduction of processors or memory operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If clock frequency reduction policy is performed to lower product temperature, then temperature is reduced, but device operation reliability deteriorates during sudden power off situations

Engineering Contradiction:
Improveproduct temperatureVSAvoiddevice operation reliability
Core Design Contradiction:
TemperatureVSReliability

Solution Approach 1:

The system performs preliminary temperature prediction using a trained artificial neural network before executing applications that may cause temperature rise. Based on the predicted temperature increase, the system proactively adjusts clock frequencies of the processor and memory in advance, rather than reactively reducing frequency only when temperature thresholds are exceeded. This preliminary action prevents sudden power off situations by maintaining temperatures within safe operating ranges throughout application execution.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If artificial neural network training is performed with multiple input parameters, then temperature prediction accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvetemperature prediction accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system collects temperature data, application execution data, and other operational parameters during normal device operation to automatically train the artificial neural network. The training process utilizes existing operational data without requiring external training datasets or additional hardware resources. The system continuously improves its temperature prediction accuracy by learning from its own operational history, thereby achieving high prediction precision while minimizing the increase in device complexity.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12625532B2Electronic device for predicting chip temperature and performing pre-operation, and operation method thereof
Publication Date: 2026.05.12 SK HYNIX INC
  • US12625532B2 patent drawing
  • US12625532B2 patent drawing
  • US12625532B2 patent drawing

AI summary

A method for operating an electronic device includes predicting a temperature rise of the electronic device when the application is started, predicting a temperature of the electronic device based on the predicted temperature rise and a current temperature of the electronic device, and lowering the temperature of the electronic device when the predicted temperature of the electronic device is higher than a preset threshold temperature.