Automated Chip Test Case Generation via Register Adaptation
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Solution Overview
Problem
Existing chip test methods are inefficient and error-prone due to the complexity of modern chip structures and frequent protocol changes, requiring cumbersome manual configuration and reconfiguration of test environments.
Innovation Solution
A chip test method that determines a register test adaptation file based on a register description file, matching it to a predetermined test case template, allowing for adaptive changes in response to test environment changes without rebuilding the environment, thereby automating the generation of test cases and improving efficiency and accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual configuration of test environment is used, then test cases can be constructed, but test efficiency is low and error rate is high
Solution Approach 1:
The patent uses template files to copy and standardize test case structures. Instead of manually creating each test case from scratch, the system copies predefined templates and automatically fills them with register information from the register description file, significantly improving test efficiency while reducing human error.
Solution Approach 2:
The system performs self-service by automatically generating test cases through programmatic processing. The test environment automatically parses register description files, matches them with templates, and generates test cases without requiring manual configuration, thereby improving productivity and reducing errors.
2Adaptability or versatility
If test environment is rebuilt when protocol changes, then chip testing can adapt to new protocols, but test efficiency is affected due to cumbersome reconfiguration
Solution Approach 1:
The patent implements a dynamic test environment that can adapt to protocol changes without complete reconfiguration. The system dynamically loads and matches register description files with corresponding templates based on the chip protocol being tested, allowing rapid adaptation to new protocols while minimizing reconfiguration time.
Solution Approach 2:
The test environment is designed with universal templates that can handle multiple protocols. Instead of creating separate test environments for each protocol, the system uses a universal template framework that can be configured to work with different chip protocols through parameter adjustments, thereby improving adaptability while reducing reconfiguration overhead.
3Reliability
If more registers are verified due to complex chip structure, then chip testing completeness is improved, but test complexity and time increase
Solution Approach 1:
The patent segments the testing process into modular components: register description files, test case templates, and automated matching logic. Each register can be independently described and tested through standardized template segments, making the overall complex testing process manageable and systematic while ensuring complete coverage of all registers.
Solution Approach 2:
The system manages test case complexity by parameterizing test configurations. Instead of creating unique complex test cases for each register, the system uses standardized templates with configurable parameters that are automatically populated from register description files. This approach maintains testing completeness while reducing the apparent complexity of individual test cases.
Data Source
AI summary
The present disclosure provides a chip test method, apparatus, and a device, and a storage medium. The chip test method includes: determining a register test adaptation file based on a register description file under a preset test environment, wherein a form of the register test adaptation file matches that of a predetermined test case template; constructing a test case based on the register test adaptation file and the test case template, and executing the test case to test a chip, wherein the determining a register test adaptation file further includes: when the preset test environment changes, determining change information of the register description file in response to the change; and changing the register test adaptation file based on the change information.