Chip Thermal Sensor Fusion for Accurate Hotspot Prediction

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Solution Overview

Problem

Existing thermal management solutions in semiconductor devices face challenges in accurately measuring temperatures in critical regions due to competing real estate interests and interference with local thermal equilibrium, leading to inaccurate thermal readings and potential overheating issues.

Innovation Solution

A predictive model using multiple thermal sensors located outside critical areas combines sensor readings and temperature gradients to accurately predict hotspot temperatures, integrating with a feedback loop for efficient thermal management.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If thermal sensors are placed in critical regions to directly measure temperature, then measurement precision improves, but device complexity and interference with thermal equilibrium worsen

Engineering Contradiction:
Improvetemperature measurement accuracyVSAvoidsensor placement complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses temperature gradient measurements from sensors placed in non-critical regions as an intermediary to indirectly determine hotspot temperatures. Instead of placing sensors directly in critical regions, the system measures gradients in accessible areas and uses these as mediators to calculate target temperatures through the thermal diffusion equation, resolving the conflict between measurement accuracy and device complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system creates a virtual representation of the thermal field by measuring gradients at accessible locations and using mathematical modeling to copy or reconstruct the temperature distribution in critical regions. This allows temperature information from hard-to-reach areas to be obtained without physically placing sensors there, maintaining measurement precision while avoiding device complexity.

Inventive Principle:
Principle #26Copying

2Measurement precision

If thermal sensors are placed in critical regions, then temperature measurement accuracy improves, but local thermal equilibrium is disturbed

Engineering Contradiction:
Improvehotspot temperature accuracyVSAvoidthermal equilibrium stability
Core Design Contradiction:
Measurement precisionVSStability of the object's composition

Solution Approach 1:

The patent employs temperature gradients in non-critical regions as intermediaries to infer hotspot temperatures without directly measuring them. By using the thermal gradient field as a mediator and applying the thermal diffusion equation, the system obtains accurate hotspot temperature data while leaving the critical thermal equilibrium undisturbed.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces direct physical measurement (mechanical sensor placement) with a mathematical modeling approach. Instead of physically inserting sensors into critical regions that would disturb thermal equilibrium, the system substitutes a computational model based on thermal diffusion equations that uses gradient measurements from safe locations to calculate target temperatures, thereby maintaining thermal stability.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If multiple thermal sensors are deployed to improve measurement accuracy, then measurement precision improves, but device complexity increases

Engineering Contradiction:
Improvethermal reading accuracyVSAvoidsensor network complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces a complex network of multiple physical sensors with a simplified system using fewer sensors combined with mathematical modeling. By substituting direct measurement with thermal diffusion equation-based calculations, the system achieves high measurement precision using minimal sensors, thereby reducing device complexity while maintaining accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system changes the measurement parameters from direct temperature readings at multiple locations to temperature gradient measurements combined with mathematical transformation. By measuring gradients at fewer locations and using the thermal diffusion equation to compute target temperatures, the system achieves equivalent or superior precision with reduced sensor count and lower device complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The model provides nearly 82% improvement in hotspot temperature prediction accuracy, enabling precise thermal monitoring and reducing overheating margins, compatible with various processor types and architectures.

Implementation Method 1

measuring a temperature of the semiconductor chip at each predetermined location using a corresponding one of the plurality of thermal sensing elements

Methodology Applied
Scientific EffectThermal detection: Thermal Radiation

Implementation Method 2

combines sensor readings and temperature gradients to accurately predict hotspot temperatures

Methodology Applied
Scientific EffectHeat conduction: Conduction (thermal)

Implementation Method 3

temperature gradients to accurately predict hotspot temperatures

Methodology Applied
Scientific EffectTemperature gradient: Temperature Gradient

Data Source

PatentUS20250210417A1Thermal sensor fusion
Publication Date: 2025.06.26 ADVANCED MICRO DEVICES INC
  • US20250210417A1 patent drawing
  • US20250210417A1 patent drawing
  • US20250210417A1 patent drawing

AI summary

A method includes forming a plurality of thermal sensing elements at predetermined locations on a semiconductor chip proximate to a target location, measuring a temperature of the semiconductor chip at each predetermined location using a corresponding one of the plurality of thermal sensing elements, and determining a temperature at the target location using the temperatures measured at each of the predetermined locations.