Machine Tool Chip Tracking Using Time-Series Image Mesh Regions

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Solution Overview

Problem

Existing machine tools face challenges in efficiently managing chip accumulation, particularly when the accumulation is small and spread over time, leading to clotting and difficulty in removal.

Innovation Solution

An information processing device that captures images of a target area within the machine tool at different times, divides the images into mesh regions, and associates chip information with each region, allowing for the tracking of chip accumulation over time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If cleaning operation is not performed frequently due to small chip accumulation, then machining can continue over long period, but chips clot and become difficult to remove

Engineering Contradiction:
Improvemachining continuityVSAvoidchip clotting
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The system performs preliminary detection of chip accumulation conditions and issues warnings before chips clot and become difficult to remove. By monitoring chip accumulation in advance and alerting operators at appropriate thresholds, the system enables proactive cleaning before harmful clotting occurs, thus maintaining machining continuity while preventing chip clumping.

Inventive Principle:
Principle #10Preliminary action

2Ease of operation

If cleaning is performed based on machining time or total chip amount, then cleaning schedule is simple to manage, but local chip accumulation is not detected

Engineering Contradiction:
Improvecleaning schedule managementVSAvoidlocal chip accumulation detection
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The system divides the machining area into multiple regions and independently monitors chip accumulation in each region. This segmentation allows precise detection of local chip accumulation while maintaining a simple overall cleaning schedule based on aggregated data or specific region thresholds, thus resolving the contradiction between operational simplicity and detection precision.

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If detailed monitoring of chip accumulation is implemented, then chip management precision is improved, but system complexity increases

Engineering Contradiction:
Improvechip accumulation monitoringVSAvoidmonitoring system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system uses image capture devices to create visual copies of chip accumulation states in different regions. These image copies are processed to extract chip accumulation information without requiring direct physical sensors in each location. This approach achieves detailed monitoring precision while keeping the physical system relatively simple by using optical copying rather than complex sensor networks.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS12236578B2Information processing device and system displaying information in time-series order on chips in regions of image captured inside machine tool
Publication Date: 2025.02.25 DMG MORI CO LTD
  • US12236578B2 patent drawing
  • US12236578B2 patent drawing
  • US12236578B2 patent drawing

AI summary

An information processing device according to the present disclosure including: a mesh division unit (102) that divides at least part of first and second images captured at different times of a target area for detecting chips generated from a workpiece, into a plurality of mesh regions, the images each being an inside image of a machine tool; and an information processing unit (103) that performs processing to associate (a) information on a first chip corresponding to a specific mesh region among the plurality of the mesh regions corresponding to the first image, (b) information on a second chip corresponding to the specific mesh region among the plurality of the mesh regions corresponding to the second image, (c) a first time related to the first image, and (d) a second time related to the second image.