Chip Tray Image Fitting for Semiconductor Detection
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Solution Overview
Problem
In semiconductor manufacturing, acquiring codes from multiple chips in a chip tray using a laser camera is time-consuming and prone to errors due to the need for manual control and limited image capturing range, hindering batch production.
Innovation Solution
An image fitting method employing multiple photographing assemblies to capture images of different areas of the chip tray simultaneously, allowing for the acquisition of an entire chip tray image in a single photographing process, thereby reducing detection time and minimizing manual operation errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a laser camera is used to acquire chip codes, then measurement precision is improved, but productivity deteriorates due to multiple photographing operations required
Solution Approach 1:
The chip tray detection area is divided into multiple regions, with each photographing assembly responsible for capturing images of specific regions simultaneously. This segmentation allows parallel acquisition of chip codes from different areas, eliminating the need for sequential photographing while maintaining code recognition accuracy
Solution Approach 2:
Multiple photographing assemblies are combined into a coordinated system that captures images of the entire chip tray simultaneously. The individual images are then merged through image fitting technology to form a complete view, enabling single-process acquisition of all chip codes and significantly improving detection throughput
2Device complexity
If manual control of laser camera is used, then device complexity is reduced, but reliability deteriorates due to human errors in operation
Solution Approach 1:
The system automatically performs image fitting and chip code recognition without requiring manual intervention. The photographing assemblies and processing system work autonomously to complete the entire detection process, eliminating human errors related to manual operation while maintaining systematic simplicity through automated workflows
3Measurement precision
If multiple photographing operations are performed, then measurement precision is maintained, but loss of time increases due to sequential processing
Solution Approach 1:
Multiple photographing assemblies perform periodic simultaneous capture operations at predetermined intervals, allowing the system to acquire images of different chip tray regions in parallel rather than sequentially. This periodic parallel action maintains recognition accuracy while dramatically reducing the total detection cycle time
Solution Approach 2:
The system maintains continuous detection capability by having multiple photographing assemblies operate simultaneously without interruption. While one assembly captures images, others are already capturing or processing, ensuring continuous flow of detection data and eliminating idle time between sequential operations
Data Source
AI summary
Embodiments of the disclosure provide an image fitting method. The method includes: providing a chip plate and a plurality of photographing assemblies, where the chip plate is used to place a chip tray, and the photographing assemblies are used to capture images of the chip plate; acquiring a chip plate image captured by each photographing assembly, where the chip plate image is an image of the chip plate with a partial area and the chip tray placed on the chip plate; acquiring a chip tray image included in each chip plate image, where the chip tray image is an image of the chip tray with a partial area; and fitting the plurality of chip tray images to acquire a chip image, where the chip image is an image of an entire chip tray.