Chiplet Supply Chain Security via Encrypted Test Verification

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The manufacturing process for integrated circuits, which involves assembling independently manufactured chiplets, faces challenges in ensuring supply chain security due to susceptibility to security attacks and the potential for counterfeit chiplets during transport between manufacturing and assembly facilities.

Innovation Solution

A system is implemented where a chiplet manufacturing interface tests each chiplet, records the test results securely, and encrypts them using a public-private key pair. These encrypted test results are stored in a shared database accessible by the chiplet integration interface, which decrypts and compares them with its own test results to verify the chiplet's trustworthiness before integration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If chiplets are manufactured separately and transported between facilities, then manufacturing flexibility and cost efficiency are improved, but supply chain security and susceptibility to counterfeit chiplets worsen

Engineering Contradiction:
Improvemanufacturing flexibilityVSAvoidsupply chain security
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The system performs preliminary testing of chiplets at the manufacturing facility and securely stores test results before transport. The chiplet integration interface retrieves and verifies these pre-stored test results before integration, ensuring supply chain security without disrupting the separate manufacturing process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

A shared database serves as an intermediary between the chiplet manufacturing interface and chiplet integration interface. This database securely stores encrypted test results, enabling verification of chiplet authenticity during transport without requiring direct physical connection between facilities

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If chiplet test results are stored securely with encryption, then supply chain security is improved, but system complexity and data management requirements worsen

Engineering Contradiction:
Improvesupply chain securityVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The shared database serves multiple functions: storing test results, encrypting data for security, and enabling retrieval by both manufacturing and integration interfaces. This multi-functionality reduces overall system complexity by consolidating multiple components into a single versatile system

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The chiplet integration interface retrieves encrypted test results from the database, decrypts them, and uses the verification feedback to determine whether to proceed with integration. This feedback mechanism ensures security while maintaining a straightforward integration process

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS20250155500A1Supply Chain Security for Chiplets
Publication Date: 2025.05.15 ADVANCED MICRO DEVICES INC
  • US20250155500A1 patent drawing
  • US20250155500A1 patent drawing
  • US20250155500A1 patent drawing

AI summary

Supply chain security for chiplets is described. In accordance with the described techniques, a chiplet manufacturing interface obtains first test results, and stores an encrypted version of the first test results in a database accessible by the chiplet manufacturing interface and a chiplet integration interface. The chiplet integration interface obtains second test results from at least one chiplet, retrieves, from the database, the encrypted version of the first test results, decrypts the encrypted version of the first test results to obtain a first hash of the first test results, and selectively integrates the at least one chiplet into an integrated circuit based on a comparison of the first test results and the second test results and a comparison of the first hash and a second hash of the second test results generated by the chiplet integration interface.