Chiplet-Based In-System Testing Under Power Budget Constraints

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Solution Overview

Problem

Existing system testing methods face limitations due to power leakage, power budget constraints, and difficulties in testing disabled components, which can affect battery life and reliability, especially in autonomous systems.

Innovation Solution

The implementation of local controllers to enable and disable chiplets dynamically during system testing, allowing power management within a threshold and using a unified test image for various configurations, thereby optimizing power consumption and reducing false failures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If system testing is performed on all system components simultaneously, then testing completeness is improved, but power consumption exceeds the power budget

Engineering Contradiction:
Improvetesting completenessVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The system divides components into groups that can be tested separately at different times. The controller selectively enables and disables groups of components during testing, allowing comprehensive testing to be performed in segments rather than all at once, thus managing power consumption within budget limits.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically adjusts which components are enabled during testing based on power budget constraints. The controller can switch between different testing configurations, enabling components as needed and disabling them when power limits are approached, making the testing process adaptable to available power resources.

Inventive Principle:
Principle #15Dynamics

2Reliability

If disabled system components are tested, then testing coverage is improved, but errors and non-responses occur

Engineering Contradiction:
Improvetesting coverageVSAvoidtesting reliability
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The system performs preliminary actions by enabling disabled components before testing begins. The controller activates components that were previously disabled, allowing them to respond to test stimuli properly, and then conducts the testing while maintaining their enabled state to ensure accurate results.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system uses feedback mechanisms where the controller monitors the status and responses of components during testing. When components are disabled, the controller receives feedback about their state and adjusts testing procedures accordingly, ensuring that disabled components are properly handled and their testing results are accurately interpreted.

Inventive Principle:
Principle #23Feedback

3Use of energy by stationary object

If local controllers are enabled to manage power during testing, then power management is improved, but power consumption increases

Engineering Contradiction:
Improvepower management efficiencyVSAvoidcontroller power consumption
Core Design Contradiction:
Use of energy by stationary objectVSUse of energy by moving object

Solution Approach 1:

The local controllers operate autonomously to manage power distribution during testing. Each controller independently monitors and adjusts power allocation to its associated components, making decisions about enabling and disabling components based on local conditions and power budget constraints, thereby reducing the need for continuous central control and optimizing overall power efficiency.

Inventive Principle:
Principle #25Self-service

4Measurement precision

If multiple test images are developed for different configurations, then testing accuracy is improved, but development complexity increases

Engineering Contradiction:
Improvetesting accuracyVSAvoidtest image development
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system employs a universal test image that can be used across different component configurations. The controller adapts the single test image to work with various enabled/disabled configurations of components, eliminating the need to create separate test images for each configuration while maintaining testing accuracy through flexible interpretation and response handling.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS12579049B2In-system testing for autonomous systems and applications
Publication Date: 2026.03.17 NVIDIA CORP
  • US12579049B2 patent drawing
  • US12579049B2 patent drawing
  • US12579049B2 patent drawing

AI summary

Systems and methods are disclosed that relate to applications and platforms for performing in-system testing for autonomous or semi-autonomous systems and applications. In some embodiments, resources of a computing system may be grouped into one or more subsets of system elements (e.g., “a chiplet”) and may be configured to be controlled via an associated local controller, which may enable and/or disable the chiplet as targeted. In embodiments, the local controllers may receive instructions from a central controller and, via the enabling and/or disabling of the chiplets, may maintain a number of resources consumed during system testing within a threshold. As a result, the system may be configured to perform system testing without additional resources and/or without redirecting resources that may be intended for other operations.