Chiplet-Based In-System Testing Under Power Budget Constraints
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Solution Overview
Problem
Existing system testing methods face limitations due to power leakage, power budget constraints, and difficulties in testing disabled components, which can affect battery life and reliability, especially in autonomous systems.
Innovation Solution
The implementation of local controllers to enable and disable chiplets dynamically during system testing, allowing power management within a threshold and using a unified test image for various configurations, thereby optimizing power consumption and reducing false failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If system testing is performed on all system components simultaneously, then testing completeness is improved, but power consumption exceeds the power budget
Solution Approach 1:
The system divides components into groups that can be tested separately at different times. The controller selectively enables and disables groups of components during testing, allowing comprehensive testing to be performed in segments rather than all at once, thus managing power consumption within budget limits.
Solution Approach 2:
The system dynamically adjusts which components are enabled during testing based on power budget constraints. The controller can switch between different testing configurations, enabling components as needed and disabling them when power limits are approached, making the testing process adaptable to available power resources.
2Reliability
If disabled system components are tested, then testing coverage is improved, but errors and non-responses occur
Solution Approach 1:
The system performs preliminary actions by enabling disabled components before testing begins. The controller activates components that were previously disabled, allowing them to respond to test stimuli properly, and then conducts the testing while maintaining their enabled state to ensure accurate results.
Solution Approach 2:
The system uses feedback mechanisms where the controller monitors the status and responses of components during testing. When components are disabled, the controller receives feedback about their state and adjusts testing procedures accordingly, ensuring that disabled components are properly handled and their testing results are accurately interpreted.
3Use of energy by stationary object
If local controllers are enabled to manage power during testing, then power management is improved, but power consumption increases
Solution Approach 1:
The local controllers operate autonomously to manage power distribution during testing. Each controller independently monitors and adjusts power allocation to its associated components, making decisions about enabling and disabling components based on local conditions and power budget constraints, thereby reducing the need for continuous central control and optimizing overall power efficiency.
4Measurement precision
If multiple test images are developed for different configurations, then testing accuracy is improved, but development complexity increases
Solution Approach 1:
The system employs a universal test image that can be used across different component configurations. The controller adapts the single test image to work with various enabled/disabled configurations of components, eliminating the need to create separate test images for each configuration while maintaining testing accuracy through flexible interpretation and response handling.
Data Source
AI summary
Systems and methods are disclosed that relate to applications and platforms for performing in-system testing for autonomous or semi-autonomous systems and applications. In some embodiments, resources of a computing system may be grouped into one or more subsets of system elements (e.g., “a chiplet”) and may be configured to be controlled via an associated local controller, which may enable and/or disable the chiplet as targeted. In embodiments, the local controllers may receive instructions from a central controller and, via the enabling and/or disabling of the chiplets, may maintain a number of resources consumed during system testing within a threshold. As a result, the system may be configured to perform system testing without additional resources and/or without redirecting resources that may be intended for other operations.


