Chromatic Confocal Microscopy Using Low Abbe Number Lens
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Solution Overview
Problem
Conventional confocal microscopy techniques face a trade-off between imaging range and resolution, with standard confocal microscopy offering superior lateral and axial resolution but limited imaging range, while chromatic confocal microscopy extends the imaging range but at the expense of resolution, making it inadequate for visualizing cellular and subcellular structures effectively.
Innovation Solution
Employing a confocal microscopy apparatus with a focusing lens made of dispersive material with a low Abbe number, such as zinc selenide (ZnSe) or gallium phosphide (GaP), which allows for extended imaging range while maintaining high lateral resolution by utilizing chromatic dispersion properties to focus different wavelength components at distinct axial positions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of stationary object
If chromatic confocal microscopy is used to extend imaging range, then imaging range is improved, but lateral resolution deteriorates
Solution Approach 1:
The patent changes the material parameter (Abbe number) of the focusing lens to extend the imaging range while maintaining resolution. By selecting lens materials with specific low Abbe numbers (e.g., zinc selenide, gallium phosphide), the system achieves extended depth imaging capability without sacrificing lateral resolution, directly resolving the technical contradiction between imaging range and resolution.
2Measurement precision
If standard confocal microscopy is used to achieve high resolution, then lateral and axial resolution are improved, but imaging range deteriorates
Solution Approach 1:
The patent modifies the optical parameter (Abbe number) of the focusing lens material to simultaneously achieve high resolution and extended imaging range. This parameter change enables the system to maintain subcellular resolution while extending the imaging depth to several millimeters, overcoming the limitation of standard confocal microscopy.
3Illumination intensity
If focusing lens material with high Abbe number is used, then transmission is improved, but chromatic dispersion capability deteriorates
Solution Approach 1:
The patent changes the material parameter (Abbe number) from high to low values to enhance chromatic dispersion capability. By selecting materials with low Abbe numbers, the system achieves strong wavelength-dependent focal plane separation, which is essential for extended depth imaging in chromatic confocal microscopy, while maintaining adequate transmission in the operational wavelength range.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution achieves an imaging range of up to 1.8 cm with an average lateral resolution of 2.46 μm, significantly improving the depth imaging capability while maintaining high resolution across the imaging axis, thus overcoming the limitations of conventional techniques.
Implementation Method 1
a focusing device including at least one focusing lens made of a dispersive focusing lens material... configured for focusing the illumination light along an imaging axis into a plurality of wavelength-dependent focal planes
Implementation Method 2
focusing the illumination light with at least one focusing lens made of a dispersive focusing lens material along an imaging axis into a plurality of wavelength-dependent focal planes
Implementation Method 3
a detector device being arranged for spectrally resolved detecting of the scattering light
Data Source
AI summary
A confocal microscopy apparatus 100 for imaging a sample 2 under investigation by chromatic confocal microscopy comprises an illumination source device 10 being arranged for creating illumination light 1 having an illumination spectrum covering a plurality of illumination wavelengths, a focusing device 40 including at least one focusing lens 41 being configured for focusing the illumination light 1 along an imaging axis z into a plurality of wavelength-dependent focal planes in an axial imaging range of a sample 2 to be investigated, wherein the at least one focusing lens 41 is further arranged for collecting scattering light 3 created in the focal planes of the sample 2, and a detector device 50 being arranged for spectrally resolved detecting of the scattering light 3, wherein the at least one focusing lens 41 is made of a dispersive focusing lens 41 material with an Abbe number equal to or below 8, like e. g. ZnSe. Furthermore, a confocal microscopy method for imaging a sample 2 to be investigated by chromatic confocal microscopy is described.