Chromatic Confocal Device Slit Stop Beam Splitter
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Solution Overview
Problem
Existing chromatic confocal measurement devices face challenges in achieving uniform illumination and simultaneous evaluation of total intensity and spectral distribution due to the limitations of optical fibers, leading to increased costs and dimensions, and the inability to evaluate both parameters simultaneously without movable parts.
Innovation Solution
A compact device using a first slit stop as a confocal aperture for uniform illumination and a second beam splitter to split light into two partial beams, allowing for the evaluation of total intensity by a linear detector and spectral distribution by a matrix detector, while utilizing an imaging optical unit with pronounced chromatic aberration to focus different wavelengths at varying heights.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If optical fibers are used to form measurement channels, then spectral evaluation is possible, but uniform illumination and imaging is not possible and measurement point spacings are limited by fiber dimensions
Solution Approach 1:
The patent segments the optical system into distinct functional components: a broadband light source, a diffuser for uniform distribution, an imaging lens for focusing, and separate detection paths. This replaces the integrated fiber-optic approach with modular components that can independently optimize for their specific functions, enabling both uniform illumination and spectral evaluation.
Solution Approach 2:
The patent introduces a diffuser as an intermediary element between the light source and the measurement region. This diffuser mediates the light distribution to achieve uniform illumination across the measurement field, while the imaging lens subsequently focuses this uniform light onto the detector, preserving spectral information without the constraints of fiber optics.
2Measurement precision
If a confocal pinhole stop is used for point measurement, then depth resolution is achieved, but continuous uniform illumination of extended regions is not possible
Solution Approach 1:
The patent transitions from one-dimensional point measurements (confocal pinholes) to two-dimensional extended region imaging by using an imaging lens that focuses light across a planar detector array. This dimensional change allows simultaneous measurement of multiple points across an extended region while maintaining depth resolution through the confocal principle applied to the imaging system.
Solution Approach 2:
The patent replaces the mechanical scanning approach of traditional confocal microscopy (moving pinholes or stages) with a static imaging system that uses an imaging lens and array detector. This substitution eliminates the need for mechanical movement while maintaining confocal depth resolution, enabling rapid imaging of extended regions.
3Adaptability or versatility
If separate detection paths are used for total intensity and spectral evaluation, then both parameters can be evaluated, but device complexity increases
Solution Approach 1:
The patent segments the detection system into two separate detection paths after a single beam splitter: one path with a linear detector for total intensity evaluation and another path with a spectrograph and array detector for spectral evaluation. This segmentation allows independent optimization of each detection path while sharing common illumination and beam splitting components, reducing overall complexity compared to fully separate systems.
Solution Approach 2:
The imaging lens serves multiple functions: it focuses light for the confocal measurement, creates the intermediate image that is split by the beam splitter, and enables both total intensity and spectral evaluation through its imaging properties. This multi-functionality reduces the need for additional specialized optical components, simplifying the overall system despite the dual evaluation capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and simultaneous evaluation of total intensity and spectral distribution across a spatial region, reducing costs and dimensions, and allowing for variable measurement point spacings and diameters without the need for movable parts, while maintaining the advantages of an extended confocal aperture.
Implementation Method 1
the imaging optical unit has a pronounced chromatic aberration. Light reflected from the measurement object is imaged by the imaging optical unit
Implementation Method 2
the measuring device comprises a second beam splitter, which splits the light reflected from the sample into two partial beams
Implementation Method 3
light of the other partial beam is spectrally split and intensities of individual wavelengths or wavelength ranges are determined
Data Source
AI summary
A chromatic confocal measuring device includes a light source, which emits light of a plurality of wavelengths, and a first beam splitter, via which the light from the light source into an imaging optical unit having chromatic aberration on. Light reflected from the measurement object is imaged by the imaging optical unit and the first beam splitter onto a first confocal detection stop arrangement, such that the first confocal detection stop arrangement functions as a confocal aperture. Light incident through the first detection stop arrangement is detected and evaluated by a first detection device. The measuring device has a first slit stop, which functions as a confocal aperture of the measuring device. The measuring device additionally includes a second detection device and a second beam splitter, wherein the second beam splitter splits the light reflected from the measurement object into a first and a second partial beam, which image the same spatial region of the measurement object. The first detection device detects light of the first partial beam by a linear detector and evaluates total intensities over all wavelengths in order to create a total intensity profile and/or a total intensity image therefrom. The second detection device at the same time spectrally splits light of the second partial beam and evaluates intensities of the light of a plurality of individual wavelengths.