Chromatogram Data Processing Orthogonal Vector Impurity Detection

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Solution Overview

Problem

Conventional methods for determining the presence of impurities superposed on target peaks in chromatograms are unreliable, particularly when the impurity cannot be detected due to overlapping spectra or low slope absorption spectra, leading to inaccurate quantitative analysis.

Innovation Solution

A chromatogram data processing system that calculates an auxiliary vector orthogonal to the target component's spectrum, using it as a filter to determine the presence of impurities by calculating the inner product of the process-target spectrum, which helps in identifying impurities even in noisy data and overlapping cases.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If conventional impurity determination methods are used, then the analysis can be performed with simple computations, but impurities cannot be detected when absorption spectra overlap or have low slope

Engineering Contradiction:
Improvecomputational simplicityVSAvoidimpurity detection reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent transforms the impurity detection problem from conventional wavelength-domain analysis to a vector space representation. By expressing absorption spectra as vectors and using orthogonal vectors as filters, the method adds a dimensional transformation that enables detection of impurities with overlapping or low-slope spectra while maintaining computational feasibility through standardized vector operations.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the parameter representation from raw absorption spectrum values to orthogonal vector projections. By calculating the inner product of the target spectrum with orthogonal filter vectors, the method transforms the detection parameters into a form that maximizes signal-to-noise ratio and enables reliable impurity detection even when conventional spectral parameters fail.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the absorption spectrum of impurity has low slope or overlaps with target component, then conventional methods fail to detect impurity, but the patent's orthogonal vector method can still identify it

Engineering Contradiction:
Improveimpurity detection accuracyVSAvoiddetection difficulty under overlapping spectra
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent extracts impurity information by projecting the target spectrum onto orthogonal vectors that are perpendicular to the target component's spectrum. This extraction method isolates the impurity signal from the overlapping target spectrum, enabling detection even when the impurity's absorption spectrum has low slope or completely overlaps with the target component in the conventional wavelength domain.

Inventive Principle:
Principle #2Taking out (Extraction)

3Productivity

If quantitative analysis is performed without impurity determination, then the analysis process is faster, but the quantitative results become inaccurate due to undetected impurities

Engineering Contradiction:
Improveanalysis speedVSAvoidquantitative analysis accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent performs impurity determination as a preliminary action before quantitative analysis by first calculating orthogonal filter vectors from the target spectrum and then using these filters to detect impurities. This preliminary screening ensures that only samples without significant impurities proceed to quantitative analysis, maintaining both speed and accuracy by avoiding unnecessary reanalysis.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10429365B2Chromatogram data processing system
Publication Date: 2019.10.01 SHIMADZU CORP
  • US10429365B2 patent drawing
  • US10429365B2 patent drawing
  • US10429365B2 patent drawing

AI summary

For vector A which expresses an absorption spectrum of a target component, vector F orthogonal to vector A is designated as a filter for extracting an impurity superposed on the target component on a chromatogram. For vector I which expresses a measured spectrum obtained by a chromatographic analysis performed on a sample, the inner product of vectors I and F is defined as an index value u of the amount of impurity. If an impurity is present, a peak-like waveform appears on a graph which shows a temporal change in the index value u for the measured spectrum obtained at each point in time of the measurement. By detecting this waveform, the presence or absence of the impurity can be correctly determined. The direction of vector F may be determined so that, when vector B which expresses a spectrum of the impurity is decomposed into vector Ba parallel to vector A and vector Bo orthogonal to vector A, vector F becomes nearly parallel to vector Bo (i.e. the cosine similarity index is maximized).