Circuit Abnormality Detection via Reference Signal Comparison

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Solution Overview

Problem

Existing processing systems face challenges in monitoring circuit failures without increasing circuit scale, particularly in applications like in-vehicle electronic systems where safety requires continuous monitoring of image capturing sensors.

Innovation Solution

A processing system is configured with multiple circuits where two or more serve as processing circuits and one as a reference circuit, allowing for abnormality determination by comparing output signals between the target and reference circuits, enabling failure monitoring without duplicating the entire processing system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple circuits are set up for signal processing to ensure system operation continuity, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvesystem operation continuityVSAvoidcircuit scale
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system divides circuits into processing circuits (for signal processing) and reference circuits (for abnormality detection), allowing independent functionality assignment. This segmentation enables the system to maintain multiple processing circuits for reliability while using a separate reference circuit for monitoring, avoiding the need to duplicate entire processing systems.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The reference circuit acts as an intermediary that receives the same input signal as processing circuits and provides a reference output for comparison. This intermediary circuit enables abnormality detection without being part of the main signal processing chain, thus maintaining processing reliability while adding minimal complexity through a dedicated monitoring component.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If reference circuits are added for abnormality determination, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoidcircuit scale
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The reference circuit is designed with the same basic structure as processing circuits but is dedicated solely to providing reference output signals. This local quality differentiation allows the reference circuit to specialize in abnormality detection while processing circuits focus on signal processing, improving measurement precision without requiring full duplication of complex processing functionality.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The reference circuit performs a partial function compared to full processing circuits - it receives and processes input signals but does not perform complete signal processing. This partial action provides sufficient reference data for abnormality detection while minimizing the complexity and resource requirements of the reference circuit itself.

Inventive Principle:
Principle #16Partial or excessive action

3Device complexity

If the number of circuits is reduced to minimize circuit scale, then device complexity is reduced, but reliability worsens

Engineering Contradiction:
Improvecircuit scaleVSAvoidfailure monitoring capability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The reference circuit serves multiple functions: it processes input signals, generates reference output signals for comparison, and enables abnormality detection across all processing circuits. This multi-functionality allows a single reference circuit to monitor multiple processing circuits, maintaining reliability while minimizing the number of additional circuits required.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The reference circuit automatically provides reference output signals that enable self-diagnosis of processing circuits through comparison. This self-service mechanism allows the system to monitor its own health status without external intervention, maintaining reliability through autonomous failure detection while minimizing additional circuit requirements.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11663069B2Processing system, sensor system, mobile object, abnormality determination method, and non-transitory storage medium
Publication Date: 2023.05.30 PANASONIC AUTOMOTIVE SYST CO LTD
  • US11663069B2 patent drawing
  • US11663069B2 patent drawing
  • US11663069B2 patent drawing

AI summary

A processing system sets up two or more circuits of a plurality of circuits as two or more processing circuits. The two or more processing circuits subject respective input signals from a sensor to signal processing. The processing system sets up at least one circuit of the plurality of circuits to serve as a reference circuit. The at least one circuit being smaller in number than the two or more processing circuits and being other than the processing circuits. The determination circuit is configured to perform abnormality determination for a determination target circuit which is any one of the two or more processing circuits based on a comparison result between an output signal of the determination target circuit and an output signal of the reference circuit.