Visualizing Circuit Analysis Parameters for Layout Debugging
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Solution Overview
Problem
Debugging circuit layout design data is challenging due to overlapping items on current density variation color maps, which do not provide useful information for identifying error locations in electrostatic discharge protection circuits.
Innovation Solution
Marking parameters such as representative current sources, voltage sinks, inter-net connections, and short groups during electrostatic discharge protection analysis in the layout design data to facilitate visual identification and correction of design flaws.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If current density variation color maps are used to analyze electrostatic discharge protection circuits, then current density distribution can be visualized, but overlapping items on the color maps make error location identification difficult
Solution Approach 1:
The patent segments the visualization by introducing discrete markers (such as numbered circles or symbolic indicators) that are placed at specific locations corresponding to analysis parameters like current sources, voltage sinks, and inter-net connections. These markers divide the overlapping color map information into distinct, identifiable segments, allowing designers to locate errors by referencing marker positions rather than interpreting overlapping continuous color variations.
2Loss of information
If multiple analysis parameters are displayed on layout design data, then comprehensive circuit analysis information is provided, but the density of information makes debugging challenging
Solution Approach 1:
The patent introduces markers as intermediary elements that mediate between the comprehensive analysis parameters and the designer's interpretation. Each marker serves as a simplified reference point that corresponds to specific analysis parameters (current sources, voltage sinks, connections), allowing designers to access comprehensive information through simple marker identification rather than directly interpreting dense parameter data.
Solution Approach 2:
The patent employs color-coded markers or color variations in the markers to encode different types of analysis parameters or different circuit elements. This allows multiple parameters to be displayed simultaneously with distinct visual identifiers, maintaining comprehensive information while reducing debugging complexity through intuitive color-based differentiation.
Data Source
AI summary
Techniques and mechanisms for marking the parameters of a circuit analysis process for visual identification are disclosed. The visually-identified parameters can then be employed with the results of the circuit analysis to debug the layout design.