Circuit Check Method for Accurate Node Voltage Analysis
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Solution Overview
Problem
Existing circuit analysis methods fail to accurately consider gate voltage during voltage transfer, leading to inaccurate static voltage analysis and subsequent circuit checks, resulting in misjudgment of circuit nodes and device voltages.
Innovation Solution
A circuit check method that sets endpoint voltages for input interface ports, calculates first node voltage considering gate voltage, and second node voltage through analysis of the conduction path, allowing for accurate application of node voltages in circuit static checks, specifically accounting for MOS device types and threshold voltages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If DC path analysis is used for voltage transfer without considering gate voltage, then the analysis process is simple, but the voltage calculation accuracy deteriorates
Solution Approach 1:
The patent segments the voltage transfer analysis into two distinct parts: DC path analysis for power/ground voltage transfer, and gate voltage analysis for transistor gate nodes. This segmentation allows each part to be analyzed with appropriate methods, improving overall accuracy without excessive complexity
Solution Approach 2:
The patent introduces gate voltage as an intermediary parameter that mediates between the DC path analysis and the actual transistor operation. By calculating gate voltage separately and using it to determine transistor conduction states, the analysis achieves better accuracy while maintaining manageable complexity
2Device complexity
If gate voltage is not considered during voltage transfer, then the analysis method is simple, but the circuit check accuracy deteriorates
Solution Approach 1:
The patent performs preliminary gate voltage calculation before conducting the main circuit check. By determining gate voltages and transistor conduction states in advance, the subsequent circuit check can proceed with accurate device states, improving reliability without significantly increasing overall complexity
Solution Approach 2:
The patent changes the analysis parameters by explicitly including gate voltage as a separate calculation parameter. This parameter change enables more accurate determination of transistor conduction states and improves circuit check reliability while maintaining acceptable method complexity
Data Source
AI summary
A circuit check method and an electronic apparatus applicable to a to-be-tested circuit are provided. The to-be-tested circuit has one or more first nodes related to a gate voltage of one or more transistor devices and a plurality of second nodes. The circuit check method includes: setting endpoint voltages of a plurality of input interface ports of the to-be-tested circuit; obtaining a first node voltage of the first node according to a conduction path of the to-be-tested circuit and the gate voltage of the transistor device; obtaining a second node voltage of each second node according to the conduction path, the endpoint voltages, and the first node voltage; and performing circuit static check on the to-be-tested circuit by applying the first node voltage and the second node voltage.