Circuit Distortion Analysis via Element Segmentation
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Solution Overview
Problem
Current methods inadequately model circuit distortion in terms of contributions from separate device elements in analog and RF circuits, particularly due to the limitations of the Volterra series method which requires high-order device derivatives not provided by real design simulations.
Innovation Solution
A method involving determining operating points with linear and nonlinear offsets to analyze distortion, calculating first-order, second-order, and third-order output values for devices, and using these to compute compression and intermodulation distortion summaries, which can be implemented using a computer with specialized hardware or software to project nonlinear-offset values onto output nodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the Volterra series method is used to calculate nonlinear effects, then detailed information on distortion caused by different nonlinear terms in different elements can be obtained, but high-order device derivatives are required which are not provided by device models used in real design simulations
Solution Approach 1:
The patent segments the distortion analysis by separating the nonlinear current into contributions from individual circuit elements. Each element's nonlinear current is calculated independently by subtracting the linearized device model current from the total current, allowing distortion to be attributed to specific components rather than treating the entire circuit as a black box.
Solution Approach 2:
The patent introduces an intermediary approach by using linear-centric circuit models as a bridge between the total nonlinear current and individual element contributions. The linearized device model serves as a mediator that allows extraction of nonlinear components without requiring high-order derivatives of the full nonlinear model.
2Ease of manufacture
If the post-simulation post-processing approach based on linear-centric circuit models is used, then high-order derivatives are not required, but the nonlinear current obtained contains cross terms implicitly and is not totally independent of other elements
Solution Approach 1:
The patent extracts the nonlinear current contribution from each individual element by subtracting the linearized model current from the total current. This extraction process isolates the nonlinear component attributable to each specific device, removing cross-term contamination that would otherwise prevent accurate attribution of distortion to individual elements.
3Adaptability or versatility
If current methods are used to model circuit distortion, then general distortion analysis can be performed, but inadequate modeling of contributions from separate device elements is achieved
Solution Approach 1:
The patent applies local quality by making the distortion analysis element-specific. Each circuit element is analyzed individually to determine its unique contribution to total distortion. This localized approach allows the same methodology to be applied to any circuit element while providing element-specific distortion metrics that reveal which components are the primary sources of nonlinearity.
Data Source
AI summary
Methods for analyzing circuit distortion based on contributions from separate circuit elements are presented. Local approximations that do not require high-order derivatives of device models are developed near an operating point for calculating distortion summaries including compression summaries and second-order intermodulation (IM2) distortion summaries.