Circuit Gain Range Equalization for Test Efficiency
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Solution Overview
Problem
Conventional power supply test methods require a wider output range than normal operating conditions, leading to reduced circuit efficiency and increased complexity, as the gain range in abnormal operating states exceeds that in normal states, necessitating efficiency sacrifices.
Innovation Solution
A test method and system that adjust the input signal of the circuit under test using a test control signal to maintain a gain range in abnormal operating states similar to that of normal operating states, thereby reducing circuit complexity and improving efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the output range is widened to test stability under different voltages, then the test coverage is improved, but the circuit efficiency deteriorates
Solution Approach 1:
The patent applies dynamics by making the input voltage adjustable and variable during testing. The test system dynamically changes the input voltage to the circuit under test, allowing the circuit to operate across different voltage conditions (including abnormal ranges) while maintaining efficient operation. This dynamic adjustment enables comprehensive stability testing without permanently sacrificing circuit efficiency, as the voltage range is only expanded during test conditions rather than normal operation.
2Adaptability or versatility
If the gain range is widened to test abnormal operating states, then the test capability is improved, but the circuit complexity increases
Solution Approach 1:
The patent introduces an intermediary test system that mediates between the circuit under test and the testing requirements. This test system includes voltage adjustment mechanisms and control circuits that expand the gain range and enable abnormal state testing without requiring the circuit under test itself to be modified or made more complex. The intermediary testing apparatus handles the complexity of wide-range testing while the circuit under test remains relatively simple.
3Adaptability or versatility
If the input voltage range is expanded for testing, then the operating condition coverage is improved, but the normal operating efficiency deteriorates
Solution Approach 1:
The patent segments the operating conditions into normal operation mode and test mode. During normal operation, the circuit operates within its optimized voltage range for maximum efficiency. During testing, the test system temporarily expands the input voltage range to cover abnormal conditions. This segmentation allows the circuit to maintain high efficiency during normal use while still being thoroughly tested under expanded conditions when needed.
Data Source
AI summary
The present disclosure generally relates to a test method and system thereof. The test method comprises: outputting a test control signal to a test power supply of the circuit under test so as to adjust an input signal of the circuit under test so that a gain range of the circuit under test in an abnormal operating state is the same as that of the circuit under test in a normal operating state when the circuit under test enters into the abnormal operating state. The present disclosure may meet requirements for equipment test without sacrificing the efficiency of circuits in normal operating state or adding complexity circuit.