Electrical Circuit Inspection via Time-Varying Voltage Calibration
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Solution Overview
Problem
Current automated inspection systems for electrical circuits lack effective methods to accurately detect defects by failing to differentiate between defective and non-defective locations, resulting in low sensitivity and accuracy.
Innovation Solution
A system that applies a time varying voltage to the electrical circuit during calibration, using a modulator and camera to sense light intensity differences, establishing a relationship between voltage outputs and light intensities to indicate defect locations, thereby enhancing defect detection sensitivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional automated inspection systems are used without time varying voltage calibration, then the system structure remains simple, but the defect detection sensitivity and accuracy are low
Solution Approach 1:
The patent applies preliminary calibration using time varying voltage to establish the relationship between voltage and light intensity before actual defect detection. This preliminary action creates a reference framework that enhances measurement precision without adding complexity to the core detection process
Solution Approach 2:
The patent changes the voltage parameter from static to time-varying during calibration, which modulates the light intensity from defective locations. This parameter change enables differentiation between defective and non-defective locations, significantly improving defect detection sensitivity
2Measurement precision
If time varying voltage calibration is applied to establish voltage-light intensity relationship, then detection accuracy improves, but the calibration process becomes more complex
Solution Approach 1:
The patent uses periodic time-varying voltage (AC voltage) during calibration to modulate the light intensity from defective locations. This periodic action creates distinguishable signal patterns that improve location differentiation accuracy while maintaining a systematic calibration approach
Solution Approach 2:
The patent introduces light intensity as an intermediary parameter that translates electrical defects into detectable optical signals. This intermediary enables accurate location differentiation by converting electrical characteristics into measurable light variations that can be captured and analyzed
3Reliability
If voltage is applied to multiple locations during calibration, then comprehensive defect coverage is achieved, but the inspection time increases
Solution Approach 1:
The patent segments the electrical circuit into multiple locations that can be calibrated and inspected independently through systematic voltage application. This segmentation allows comprehensive defect coverage across all locations while enabling efficient parallel processing and reduced total inspection time
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves a significantly improved signal-to-noise ratio and detection sensitivity, enabling more accurate identification of defects in electrical circuits.
Implementation Method 1
a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected
Implementation Method 2
a defect detection subsystem, employing an output of the calibration subsystem, and being operative in the defect detection mode when a desired time varying voltage is being applied to the electrical circuit being inspected
Data Source
AI summary
A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.