Circuit End-of-Life Prediction Using Sensor-Based Reliability Models
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Solution Overview
Problem
The unpredictability of semiconductor circuit degradation due to varying stress conditions leads to overdesigning, increasing development and production costs, as the actual operational lifetime of semiconductor circuits is difficult to predict.
Innovation Solution
Incorporating a lifetime model unit within semiconductor circuits that uses sensed data and accelerated reliability models to estimate remaining life, enabling predictive alerts for maintenance before circuit failure occurs, thereby promoting safety and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If semiconductor circuits are designed to tolerate worst-case mission profile, then reliability is improved, but development and production costs increase
Solution Approach 1:
The patent applies preliminary action by implementing a lifetime model unit that continuously monitors circuit health parameters and predicts remaining useful life before actual failure occurs. This allows maintenance to be scheduled proactively based on predicted degradation trends rather than designing for worst-case scenarios from the outset, thereby reducing overdesign while maintaining reliability.
Solution Approach 2:
The patent implements feedback through a monitoring system that continuously tracks circuit performance parameters and feeds this information to the lifetime model unit. The model uses this feedback to update degradation predictions and adjust maintenance recommendations, allowing the system to adapt to actual usage conditions rather than relying on conservative worst-case design assumptions.
2Reliability
If semiconductor circuits are designed for worst-case stress conditions, then safety is improved, but actual operational lifetime becomes unpredictable
Solution Approach 1:
The patent applies dynamics by transitioning from a static worst-case design approach to a dynamic lifetime prediction system. The lifetime model unit continuously adapts its predictions based on real-time monitoring of circuit health parameters and actual stress conditions, allowing the system to accurately predict operational lifetime under varying conditions rather than assuming constant worst-case stress.
Solution Approach 2:
The patent implements parameter changes by using the lifetime model unit to track and analyze changes in circuit health parameters over time. The model processes variations in temperature, voltage, current, and other operational parameters to predict remaining useful life, enabling accurate lifetime estimation despite changing operating conditions rather than relying on fixed worst-case assumptions.
3Productivity
If lifetime prediction system is implemented, then maintenance timing is optimized, but device complexity increases
Solution Approach 1:
The patent applies universality by designing the lifetime model unit to perform multiple functions: monitoring circuit health, predicting remaining useful life, generating maintenance alerts, and providing diagnostic information. This multi-functional approach consolidates what could be multiple separate systems into a single integrated unit, reducing overall system complexity while maintaining comprehensive maintenance optimization capabilities.
Data Source
AI summary
In some examples, a circuit may be configured to perform a method that includes performing a circuit function via a circuit function unit of a circuit, receiving sensor data from one or more sensors associated with the circuit function unit, and estimating a remaining life of the circuit based on an accelerated reliability model and the sensor data, wherein the sensor data comprises input to the accelerated reliability model. The circuit itself may include a dedicated circuit unit that estimates the remaining life of the circuit based on an accelerated reliability model and the sensor data, and the circuit may output one or more predictive alerts or predictive faults when the remaining life is below a threshold, which may prompt the system for predictive maintenance on the circuit.