Circuit Modification via Memory Translation Path Testing
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Solution Overview
Problem
Existing circuit testing and modification techniques are inefficient in identifying and correcting defects in memory address mappings, leading to prolonged testing times and potential errors in data retrieval.
Innovation Solution
A processor-generated test template that modifies translation paths by changing virtual memory addresses to alternate physical memory addresses, allowing for the detection and prevention of defects during execution, thereby ensuring accurate data access.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional circuit testing methods are used, then testing can be performed, but testing time is prolonged and defects in memory address mappings are not efficiently identified
Solution Approach 1:
The patent applies preliminary action by pre-modifying the translation path before actual circuit testing. The system detects a predetermined modification to the translation path that changes physical memory address mappings, and generates a test template with instructions to implement this modification. This preliminary setup allows the testing process to directly evaluate defect detection capabilities without time-consuming traditional testing procedures.
2Reliability
If memory address mapping defects are not detected, then circuits may contain errors, but detecting and correcting these defects requires complex testing procedures
Solution Approach 1:
The patent uses an intermediary approach by introducing a test template as a mediator between the circuit under test and the defect detection process. The test template contains predetermined instructions that modify the translation path and facilitate defect detection. This intermediary structure simplifies the testing complexity while maintaining high reliability, as the template guides the testing process through standardized modification and detection steps.
3Measurement precision
If translation paths are not modified for testing, then original memory mappings are preserved, but defects in address mappings cannot be effectively detected
Solution Approach 1:
The patent applies parameter changes by modifying the translation path parameters during testing. The system detects a predetermined modification to the translation path that changes the mapping between virtual and physical memory addresses. By altering these parameters in a controlled manner through the test template, the system achieves precise defect detection while maintaining ease of implementation through automated parameter modification.
Data Source
AI summary
Techniques for modifying a circuit are described herein. In some examples, a method includes generating a set of testing data and detecting a predetermined modification to a translation path corresponding to a memory address mapping, the predetermined modification to change a physical memory address of the testing data associated with a virtual memory address to a second physical memory address of the testing data. The method can also include generating a test template comprising a first instruction to implement the predetermined modification and a second instruction comprising the second physical memory address in the translation path and transmitting the test template to the circuit for each of a plurality of software instruction threads. Furthermore, the method can include detecting a defect in the execution of the test template by the circuit and modifying the circuit to prevent the defect during execution of the test template.