Circuit Validation Prototype System for FPGA Test Coverage

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Solution Overview

Problem

Circuit validation for digital circuit systems is a time-consuming and complex process due to the need for numerous complicated test cases, leading to inadequate test coverage and prolonged simulation times, especially when dealing with sophisticated systems involving different clock domains and circuit hierarchies.

Innovation Solution

A system and method for circuit validation utilizing a prototype system with a programmable logic device circuit and a computing device to generate and test input signals, with an input generation circuit and output acquisition circuit, allowing for efficient verification of circuit modules by leveraging hardware acceleration and software flexibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If comprehensive test cases are used to verify circuit design, then test coverage is improved, but simulation time increases dramatically

Engineering Contradiction:
Improvetest coverageVSAvoidsimulation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the circuit design verification process into two distinct phases: (1) a hardware-based prototype verification phase using FPGA that provides fast feedback for structural and functional validation, and (2) a software-based simulation phase that provides detailed signal monitoring and debugging capabilities. This segmentation allows each method to be used for its strengths, reducing overall verification time while maintaining comprehensive test coverage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a hardware prototype system as an intermediary between the circuit design and final validation. This prototype acts as a mediator that provides rapid verification feedback without requiring exhaustive simulation, thereby reducing the time burden while maintaining reliability. The prototype serves as a bridge that allows designers to quickly validate their designs before investing time in detailed simulation analysis.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If detailed monitoring of synchronization process is implemented, then debugging capability is improved, but test pattern complexity increases

Engineering Contradiction:
Improvedebugging capabilityVSAvoidtest pattern complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent segments the verification approach into two distinct modes: hardware-based verification for structural validation and software-based simulation for detailed debugging. This segmentation allows detailed monitoring and debugging capabilities to be accessed only when needed through the simulation mode, rather than requiring complex test patterns to be designed and implemented in all verification scenarios.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The simulation environment provides self-service debugging capabilities through automated monitoring of synchronization signals and automatic generation of verification reports. The system automatically tracks signal transitions, clock domain crossings, and synchronization status, reducing the need for manually designed complex test patterns while maintaining ease of debugging.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS20240118339A1System, method for circuit validation, and system and method for facilitating circuit validation
Publication Date: 2024.04.11 SK HYNIX INC
  • US20240118339A1 patent drawing
  • US20240118339A1 patent drawing
  • US20240118339A1 patent drawing

AI summary

System, method for circuit validation, and system and method for facilitating circuit validation are provided. The circuit validation system comprises a prototype system and a computing device. The prototype system comprises a programming logic device circuit configured to implement a modified circuit design. The modified circuit design includes a circuit module as a design under test (DUT), an input generation circuit coupled to the circuit module for outputting input signals to the circuit module in response to a test signal, and an output acquisition circuit coupled to the circuit module for storing output data from the circuit module. The computing device is capable of being coupled to the prototype system and configured to generate the test signal to perform a test of the DUT on the prototype system.