Clamp Probe Bending Portions for Compact Battery Testing
Solution Overview
Problem
Existing clamp-type probe devices for testing electrical components, such as pouch-type batteries, face challenges in efficiently and reliably clamping test objects without causing damage or stress, while maintaining a compact design and high testing efficiency.
Innovation Solution
A clamp-type probe device comprising a first and second pressed member with clamping portions and a probe head, where the probe head's contacting members have bending portions that engage with assembly holes, allowing for a clamping mechanism that is lightweight, compact, and capable of conducting charge/discharge tests without additional fastening mechanisms, utilizing pneumatic drive units to move the pressed members and maintain alignment through guiding grooves.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If additional fastening mechanisms are used to secure the probe head, then the reliability of the probe device is improved, but the device complexity and size increase
Solution Approach 1:
The contacting members are designed to automatically engage with the assembly holes through their bending portions, eliminating the need for additional fastening mechanisms. The elastic properties of the contacting members enable self-securing through the clamping action itself, achieving reliability without increased complexity
Solution Approach 2:
The bending portions of the contacting members act as intermediaries between the probe head and the assembly holes. These bending portions transmit the clamping force while maintaining electrical contact, serving as a mediating element that secures the probe without requiring separate fastening components
2Volume of moving object
If the probe device is designed to be compact, then the manufacturing yield is improved, but the clamping force and testing reliability may be compromised
Solution Approach 1:
The probe device is segmented into modular components: multiple contacting members are distributed across the probe head, each independently engaging with assembly holes. This segmentation allows the compact probe head to deliver clamping force through multiple distributed contact points rather than requiring a single large mechanism
Solution Approach 2:
The contacting members utilize flexible bending portions that can deform elastically to engage with the assembly holes. This flexibility allows the compact probe structure to maintain reliable electrical contact while adapting to slight variations in the test object surface, ensuring testing reliability within a compact form factor
3Measurement precision
If the contacting members are made rigid to maintain stable electrical contact, then the measurement precision is improved, but the stress transmission to test objects increases causing damage
Solution Approach 1:
The contacting members transition from a purely rigid state to an elastic state through their bending portions. This parameter change allows them to maintain stable electrical contact through elastic deformation rather than rigid constraint, reducing stress transmission to the test object while preserving measurement precision
Solution Approach 2:
The bending portions of the contacting members provide beforehand cushioning by absorbing clamping forces through elastic deformation. This cushioning effect protects the test object from excessive stress while ensuring stable electrical contact for precise measurements during the testing process
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient clamping and testing of multiple objects simultaneously, minimizing size and stress transmission, while preventing damage to test objects and maintaining flexibility in the probe components, thus enhancing testing efficiency and reliability.
Implementation Method 1
The two bending portions of each of the plurality of contacting members are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole
Data Source
AI summary
A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.