Semiconductor Package Clip Standoff for Uniform Solder Bond Lines

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Solution Overview

Problem

Conventional semiconductor packages with clip connections face issues of uneven bond line thickness (BLT) of solder, leading to clip and die tilting, reliability problems, and degraded electrical performance due to solder cracking during heat cycling.

Innovation Solution

Incorporating protruding standoffs on the surface of vertical semiconductor dies to maintain uniform solder thickness between the die and clip, formed during wafer fabrication to control BLT and prevent tilting.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional clip packages are used without standoffs, then the structure is simpler and manufacturing is easier, but the bond line thickness of solder becomes uneven causing clip and die tilting

Engineering Contradiction:
Improvebond line thickness uniformityVSAvoidpackage structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The standoff structures are formed on the die surface during wafer fabrication before packaging, preliminarily establishing the height reference that will control solder thickness. This preliminary action ensures uniform bond line thickness is built into the structure before the soldering process occurs.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The standoff acts as an intermediary element between the die and the clip, providing a physical height reference that mediates the solder deposition process. This intermediary structure ensures uniform solder thickness by preventing direct contact between the die and clip during reflow.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If solder reflow process is performed without standoffs, then the assembly process is simpler, but the solder moves the clip and die in z direction causing tilt and non-uniformity

Engineering Contradiction:
Improvesolder joint reliabilityVSAvoidassembly process simplicity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The standoff structures are formed on the die surface during wafer fabrication before packaging, preliminarily establishing the height reference that will control solder thickness. This preliminary action ensures uniform bond line thickness is built into the structure before the soldering process occurs.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The standoff provides preliminary counter-action to the z-direction movement forces during solder reflow. By providing a physical barrier at a specific height, the standoff prevents the solder from pushing the die and clip together, thereby counteracting the tilting force before it can cause damage.

Inventive Principle:
Principle #9Preliminary anti-action

3Reliability

If uneven bond line thickness occurs, then manufacturing is easier without additional structures, but solder cracking occurs during heat cycling leading to reliability problems

Engineering Contradiction:
Improveheat cycling reliabilityVSAvoidsolder thickness control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The standoff structures are formed on the die surface during wafer fabrication before packaging, preliminarily establishing the height reference that will control solder thickness. This preliminary action ensures uniform bond line thickness is built into the structure before the soldering process occurs.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The standoff acts as an intermediary element between the die and the clip, providing a physical height reference that mediates the solder deposition process. This intermediary structure ensures uniform solder thickness by preventing direct contact between the die and clip during reflow.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Reliability

If clips and die tilt during assembly, then the assembly process remains simple, but thin solder regions form causing electrical performance degradation

Engineering Contradiction:
Improveelectrical performance reliabilityVSAvoiddie structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The standoff structures are formed on the die surface during wafer fabrication before packaging, preliminarily establishing the height reference that will control solder thickness. This preliminary action ensures uniform bond line thickness is built into the structure before the soldering process occurs.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The standoff acts as an intermediary element between the die and the clip, providing a physical height reference that mediates the solder deposition process. This intermediary structure ensures uniform solder thickness by preventing direct contact between the die and clip during reflow.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution ensures consistent solder thickness, enhancing the reliability and electrical performance of semiconductor packages by preventing solder cracking and improving thermal management, thus reducing electrical parasitic switching and conduction losses.

Implementation Method 1

During a solder reflow process the solder reflow tends to move the clip and the vertical die in z (height) direction causing tilt

Methodology Applied
Scientific EffectSolder reflow: Melting

Implementation Method 2

create a protruding standoff(s) on the surface of the vertical die that will maintain the BLT through the solder interface between the vertical die(s) and the clip

Methodology Applied
Scientific EffectPhysical barrier effect:

Implementation Method 3

A first clip is on the first vertical device that is solder connected to a terminal of the first vertical device on a second side opposite to the first side providing a first solder bonded interface

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 4

A vertical semiconductor device is attached on a first side by a die attach material to the die pad

Methodology Applied
Scientific EffectAdhesive bonding: Adhesive

Data Source

PatentUS11908780B2Semiconductor package with solder standoff
Publication Date: 2024.02.20 TEXAS INSTRUMENTS INC
  • US11908780B2 patent drawing
  • US11908780B2 patent drawing
  • US11908780B2 patent drawing

AI summary

A semiconductor package includes a leadframe including a die pad and a plurality of lead terminals. A vertical semiconductor device is attached on a first side by a die attach material to the die pad. A first clip is on the first vertical device that is solder connected to a terminal of the first vertical device on a second side opposite to the first side providing a first solder bonded interface, wherein the first clip is connected to at least a first of the lead terminals. The first solder bonded interface includes a first protruding surface standoff therein that extends from a surface on the second side of the first vertical device to physically contact the first clip.